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DRAM Yield Analysis and Optimization by a Statistical Design Approach

IEEE Transactions on Circuits and Systems I: Regular Papers, 2011
In this paper the electric yield of DRAM core circuits is investigated by means of a statistical approach that incorporates a hierarchical linear Gaussian model for the DRAM core sensing process and a lognormal distribution model for the DRAM cell leakage.
Yan Li 0030   +4 more
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Statistical design and optimization of SRAM cell for yield enhancement

IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004., 2005
We have analyzed and modeled the failure probabilities of SRAM cells due to process parameter variations. A method to predict the yield of a memory chip based on the cell failure probability is proposed. The developed method is used in an early stage of a design cycle to minimize memory failure probability by statistically sizing of SRAM cell.
Saibal Mukhopadhyay   +2 more
openaire   +1 more source

Max–min optimal discriminating designs for several statistical models

Statistics and Computing, 2015
zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Chiara Tommasi   +2 more
openaire   +4 more sources

Design of Experiments and Statistical Optimization in Manufacturing

2014
In this chapter is described the design of experiments methodology as tool widely used in the identification of sources of variation in manufacturing production processes, helping to improve quality systems. It also reports a case study, in which a production process is characterized and the main components to be integrated into a final product ...
María Blanca Becerra-Rodríguez   +3 more
openaire   +1 more source

An Application of Combinatorial Optimization to Statistical Physics and Circuit Layout Design

Operations Research, 1988
We study the problem of finding ground states of spin glasses with exterior magnetic field, and the problem of minimizing the number of vias (holes on a printed circuit board, or contacts on a chip) subject to pin preassignments and layer preferences.
Barahona, Francisco   +3 more
openaire   +2 more sources

Statistical synthesis and optimal decomposition in the intelligent monitoring systems design

Proceedings of the International Workshop on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications. IDAACS'2001 (Cat. No.01EX510), 2002
The paper presents new results concerning formalisation and optimisation of the intelligent monitoring systems design. The attention is focused on the development of conceptual and mathematical frameworks, based on optimal synthesis theory adapted to the specifics of IMS design.
Anatoliy A. Platonov, Wieslaw Winiecki
openaire   +2 more sources

Statistical Design of Experiments for Screening and Optimization

Chemie Ingenieur Technik, 2019
AbstractDesign of experiments (DoE) is a family of methods for performing experiments that are maximally informative for a chosen mathematical model. Statistical design of experiments focuses on empirical models that are sufficiently flexible as to describe a wide variety of systems, while having favorable mathematical properties for convenient ...
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Statistical Optimization of Circuit Design

1969
In this paper the possibility of a statistical approach to the optimum design problem for a given circuit topology is considered.Given a merit figure η depending on the circuit properties, it is attempted to find out that component specification for which \(\mathop \eta \limits^ \wedge \) is maximum under the following conditions: $${\mathop ...
openaire   +1 more source

Statistical Models for Space Filling Designs and Optimalities of Uniform Designs

SAE Technical Paper Series, 2003
<div class="htmlview paragraph">Computer experiments are very useful for exploring complicated physical phenomena in various research fields of science and engineering. Construction of computer experiments is a crucial step during the planning of experiments. There are many space filling designs for computer experiments.
Kai Tai Fang, Runze Li
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Statistical Design Approach To Optimized Submicron Lithography

SPIE Proceedings, 1988
Device design rules now approach 0.5μm geometries. Process complexities and the performance of conventional equipment necessitate a more sophisticated technique for process optimization. Statistically designed experiments (SDE) and response surface analyses have, to a limited extent, addressed this need, but have fallen short in their ability to handle
R. M. Lazarus   +3 more
openaire   +1 more source

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