Results 1 to 10 of about 1,134,922 (335)

Improving Structured Grid-Based Sparse Matrix-Vector Multiplication and Gauss–Seidel Iteration on GPDSP

open access: yesApplied Sciences, 2023
Structured grid-based sparse matrix-vector multiplication and Gauss–Seidel iterations are very important kernel functions in scientific and engineering computations, both of which are memory intensive and bandwidth-limited.
Yang Wang   +5 more
doaj   +1 more source

Device-Simulation-Based Machine Learning Technique for the Characteristic of Line Tunnel Field-Effect Transistors

open access: yesIEEE Access, 2022
With the rapid growth of the semiconductor manufacturing industry, it has been evident that device simulation has been considered a sluggish process.
Chandni Akbar   +2 more
doaj   +1 more source

Deep Learning Algorithms for the Work Function Fluctuation of Random Nanosized Metal Grains on Gate-All-Around Silicon Nanowire MOSFETs

open access: yesIEEE Access, 2021
Device simulation has been explored and industrialized for over 40 years; however, it still requires huge computational cost. Therefore, it can be further advanced using deep learning (DL) algorithms.
Chandni Akbar, Yiming Li, Wen-Li Sung
doaj   +1 more source

A Hybrid 1D-CNN-LSTM Technique for WKF-Induced Variability of Multi-Channel GAA NS- and NF-FETs

open access: yesIEEE Access, 2023
Presently deep learning (DL) techniques are massively used in the semiconductor industry. At the same time, applying a deep learning approach for small datasets is also an immense challenge as larger dataset generation needs more computational time-cost ...
Sagarika Dash, Yiming Li, Wen-Li Sung
doaj   +1 more source

Effects of Random Nanosized TiN Grain on Characteristic of Gate-All-Around FinFETs with Ferroelectric HZO Layer

open access: yesNanoscale Research Letters, 2022
In this paper, we computationally study electrical characteristics for gate-all-around fin field effect transistors (GAA FinFETs) and negative capacitance GAA FinFETs (NC-GAA FinFETs) for sub-3-nm technological nodes.
Yiming Li, Min-Hui Chuang, Yu-Chin Tsai
doaj   +1 more source

A Machine Learning Approach to Modeling Intrinsic Parameter Fluctuation of Gate-All-Around Si Nanosheet MOSFETs

open access: yesIEEE Access, 2022
The sensitivity of semiconductor devices to any microscopic perturbation is increasing with the continuous shrinking of device technology. Even the small fluctuations have become more acute for highly scaled nano-devices.
Rajat Butola   +2 more
doaj   +1 more source

Electronic Structures of Monolayer Binary and Ternary 2D Materials: MoS2, WS2, Mo1−xCrxS2, and W1−xCrxS2 Using Density Functional Theory Calculations

open access: yesNanomaterials, 2022
Two-dimensional (2D) materials with binary compounds, such as transition-metal chalcogenides, have emerged as complementary materials due to their tunable band gap and modulated electrical properties via the layer number.
Chieh-Yang Chen   +2 more
doaj   +1 more source

Highly Parallel Computation [PDF]

open access: yesScience, 1990
Highly parallel computing architectures are the only means to achieve the computational rates demanded by advanced scientific problems. A decade of research has demonstrated the feasibility of such machines, and current research focuses on which architectures are best suited for particular classes of problems.
Denning, P. J., Tichy, Walter F.
openaire   +2 more sources

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