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SESSION 9 - Parameter Extraction
Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat No 04CH37516) ICMTS-04, 2004openaire +1 more source
Session IV: Parameter extraction
2010 IEEE 14th Workshop on Signal Propagation on Interconnects, 2010openaire +1 more source
Session 2: Parameter Extraction
2006 IEEE International Conference on Microelectronic Test Structures, 2006openaire +1 more source