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Non-Destructive Testing Using Picosecond Ultrasonics
AIP Conference Proceedings, 2006Picosecond ultrasonics has become a widely used metrology tool in the semiconductor device industry. It provides an accurate method for the measurement of the thickness of thin films, can determine the quality of the bonding between a film and a substrate, and gives information about mechanical properties. We describe the development of this technology
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Glass transition of nanometric polymer films probed by picosecond ultrasonics
Ultrasonics, 2022Delia Brick, Vitalyi E Gusev
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Effect of probe pulse duration in picosecond ultrasonics
Applied Physics Letters, 2022Xu-Tang Tao +2 more
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Deep learning-based identification of characteristic regions for picosecond ultrasonics metrology
Measurement: Journal of the International Measurement Confederation, 2023Shiyuan Liu
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In Vitro picosecond ultrasonics in a single cell
Applied Physics Letters, 2008Mathieu Ducousso +1 more
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Subsurface imaging of grain microstructure using picosecond ultrasonics
Acta Materialia, 2016Marat Khafizov +2 more
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Three-dimensional imaging of biological cells with picosecond ultrasonics
Applied Physics Letters, 2015Osamu Matsuda +2 more
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