Results 211 to 220 of about 2,694,809 (245)

Extrinsic Contributions to Piezoresponse Force Microscopy

MRS Proceedings, 2005
AbstractPiezoresponse force microscopy (PFM) is the method of choice to investigate piezoactivity on a nanometer scale. A careful distinction between intrinsic and extrinsic effects are mandatory, especially when measuring ferroelectric nanostructures. We focus on two omnipresent extrinsic contributions with a substantial impact: firstly adsorbates on ...
Frank Peter, Bernd Reichenberg, Andreas Rüdiger, Rainer Waser, Krzysztof Szot   +4 more
openaire   +2 more sources

Piezoresponse force microscopy for imaging of GaN surfaces

physica status solidi (a), 2005
AbstractSurfaces of GaN films have been investigated by Atomic Force Microscopy (AFM) with implemented Piezoelectric Force Microscopy (PFM) technique. The GaN layers were grown by molecular beam epitaxy (MBE) on Si(111) substrates with an AlN buffer layer. Simultaneous imaging of surface morphology in the AFM and PFM response was performed.
R. Calarco, R. Meijers, T. Stoica, H. Lüth   +3 more
openaire   +2 more sources

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Piezoresponse force microscopy at sub-room temperatures

Review of Scientific Instruments, 2013
Piezoresponse force microscopy is demonstrated at temperatures between −80 °C and +120 °C using a commercial room temperature atomic force microscope upgraded with a home-built cooling/heating-stage. We applied temperature-ramp-synchronized piezoresponse force microscope (PFM) for tracing the temperature dependence of the formation of ferroelectric ...
Lilienblum M, Hoffmann A, Soergel E, Becker P, Bohatý L, Fiebig M   +5 more
openaire   +3 more sources

Lateral Resolution in Piezoresponse Force Microscopy

Microscopy and Microanalysis, 2008
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7 ...
T Jungk, Á Hoffmann, E Soergel
openaire   +1 more source

A coupled analysis of the piezoresponse force microscopy signals

Applied Physics Letters, 2011
We present a coupled theory on the piezoresponse force microscopy (PFM) responses by solving the electromechanical equations for transversally isotropic piezoelectric materials. The effective piezoelectric coefficients calculated from the coupled, the decoupled, and the indentation theories are then compared with the true piezoelectric coefficient d33.
J. H. Wang, C. Q. Chen
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Symmetries in Piezoresponse Force Microscopy

2010
The tremendous success of piezoresponse force microscopy (PFM) in various fields of material research has been driven by its promise to locally reconstruct the piezoelectric tensor and thus the polarization state by value and orientation. In order to achieve such a reconstruction, PFM generally allows for the collection of five different signals at ...
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Local Polarization Switching in Piezoresponse Force Microscopy

Ferroelectrics, 2007
Piezoresponse Force Spectroscopy (PFS) has emerged as a powerful tool for probing polarization dynamics on the nanoscale. Application of a dc bias to a nanoscale probe in contact with a ferroelectric surface results in the nucleation and growth of a ferroelectric domain below the probe apex.
Anna N. Morozovska, Sergei V. Kalinin, Eugene A. Eliseev, Sergei V. Svechnikov   +3 more
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A New Modeling Framework for Piezoresponse Force Microscopy

Volume 10: Mechanics of Solids and Structures, Parts A and B, 2007
Piezoresponse force microscopy (PFM) has evolved into useful tool for measurement of local functionality of ferroelectric materials which shows great potential for applications such as data storage, ferroelectric lithography and nonvolatile memories. Better understanding of current techniques which are applied in the scale of single grain requires a ...
Amin Salehi-Khojin, Nader Jalili
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Polar Structures in Relaxors by Piezoresponse Force Microscopy

2010
This chapter introduces the structural background of the appearance of polar nanoregions in relaxors, describes their major macroscopic dielectric and ferroelectric properties, and presents the results of recent investigations of local polar structures by piezoresponse force microscopy (PFM).
V. V. Shvartsman, W. Kleemann, D. A. Kiselev, I. K. Bdikin, A. L. Kholkin   +4 more
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Multifrequency effects in Piezoresponse Force Microscopy

2018
Peer ...
Domingo, Neus, Lozano, Helena, Murillo Rodríguez, Gonzalo   +2 more
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