Results 81 to 90 of about 22,383 (289)
Microstructure Evolution of a VMnFeCoNi High‐Entropy Alloy After Synthesis, Swaging, and Annealing
The synthesis and processing (rotary swaging and annealing) of the novel VMnFeCoNi alloy is investigated, alongside the estimation of the grain size effect on hardness. Analysis of a wide grain size range of recrystallized microstructures (12–210 µm) reveals a low annealing twin density.
Aditya Srinivasan Tirunilai +6 more
wiley +1 more source
This paper investigates a new direction in the area of cluster planarity by addressing the following question: Let G be a graph along with a hierarchy of vertex clusters, where clusters can partially intersect.
Walter Didimo +2 more
doaj +1 more source
We say that a graph $H$ is planar unavoidable if there is a planar graph $G$ such that any red/blue coloring of the edges of $G$ contains a monochromatic copy of $H$, otherwise we say that $H$ is planar avoidable. That is, $H$ is planar unavoidable if there is a Ramsey graph for $H$ that is planar. It follows from the Four-Color Theorem and a result of
Axenovich, M. +3 more
openaire +6 more sources
Additional PC-Tree Planarity Conditions
Recent research efforts have produced new algorithms for solving planarity-related problems. One such method performs vertex addition using the PC-tree data structure, which is similar to but simpler than the well-known PQ-tree.
Boyer, John M., John M. Boyer
core +1 more source
Clustered Planarity with Pipes [PDF]
We study the version of the C-Planarity problem in which edges connecting the same pair of clusters must be grouped into pipes, which generalizes the Strip Planarity problem. We give algorithms to decide several families of instances for the two variants
Angelini, Patrizio, Da Lozzo, Giordano
core +1 more source
Tailoring Functional Properties of Ti–Ni–Cu Shape Memory Alloy Thin Films for MEMS Actuators
A comprehensive study of critical parameters required to develop well‐performing Ti–Ni–Cu thin film shape memory alloy microactuators is provided. Materials science and device integration aspects are integrated by addressing structural and physical relationships using complementary characterization techniques as well as a practical fabrication solution
Elaheh Akbarnejad +6 more
wiley +1 more source
Creep Properties and Deformation Mechanism of Additively Manufactured NiAl‐CrMo Composites
Additively manufactured NiAl‐CrMo composites contain numerous interfaces and cell boundaries that control their creep response. At 700°C under high applied stress, creep is dominated by dislocation‐controlled power‐law mechanisms. At 800°C–900°C and lower stresses, creep is primarily diffusion‐controlled along cell boundaries.
Jan Vollhüter +9 more
wiley +1 more source
Parameterized Complexity of 1-Planarity
We consider the problem of drawing graphs with at most one crossing per edge. These drawings, and the graphs that can be drawn in this way, are called $1$-planar.
Michael Bannister +2 more
doaj +1 more source
Planarity is an important concept in graph drawing. It is generally accepted that planar drawings are well understandable. Recently, several variations of planarity have been studied for advanced graph concepts such as k-level graphs and clustered graphs.
Michael Forster, Christian Bachmaier
core +1 more source
Reproduction of stacking fault energy calculations from literature with a semi‐automated large language model‐assisted extraction procedure: extraction of simulation protocol, atomistic structures, computational parameters, and reported results, ontology alignment, knowledge graph construction and, finally, recomputation forvalidation.
Sepideh Baghaee Ravari +5 more
wiley +1 more source

