Results 181 to 190 of about 20,095 (311)
Synthesis of Homogeneously {100}-Textured 3-Inch Free-Standing Diamond Wafer. [PDF]
Zhang J +3 more
europepmc +1 more source
Theoretical investigation of the noise performance of active pixel imaging arrays based on polycrystalline silicon thin film transistors. [PDF]
Koniczek M +4 more
europepmc +1 more source
A novel brand‐new co‐firing slow solidification process has been used to prepare Cs3Cu2I5: In single crystals (SCs), which demonstrate record‐breaking X‐ray detection performance. The regular‐shaped Cs3Cu2I5: In wafer obtains a high light yield (74 368 Ph MeV−1), which is the highest related to indium‐doped Cu‐based perovskites.
Rui Liu +6 more
wiley +1 more source
A Review of the Machining Mechanisms in Field-Assisted Cutting of Brittle Materials. [PDF]
Sheng X, Zhu Z, Liu C.
europepmc +1 more source
This study presents a novel quantum dot electrophoretic display (QDEPD), which combines electro‐controlled reflection and optically‐triggered emission to achieve efficient multi‐modal switching within a single pixel. By incorporating multi‐component nanostructures, the system enhances functional integration and multi‐modal response capabilities.
Xingke Zheng +8 more
wiley +1 more source
Improving Fabrication and Performance of Porous Silicon Electron Emission Devices via Functional Layer Resistivity Modulation. [PDF]
Dong J +9 more
europepmc +1 more source
Air Stability of Sulfide Solid Electrolytes: From Theoretical Insights to Practical Solutions
This paper reviews research progress on the air stability of SSEs, covering their instability mechanisms and modification strategies, while outlining core challenges and future directions for practical applications. Sulfide solid electrolytes are pivotal for enabling high‐performance all‐solid‐state batteries due to their high ionic conductivity and ...
Hongbing Ding +10 more
wiley +1 more source
Uncovering piezoelectric effect in polycrystalline diamond membranes. [PDF]
Jing J +11 more
europepmc +1 more source
Characterization of polysilicon thin films using in situ and ex situ spectroscopic ellipsometry [PDF]
Petrik, Péter
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