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A new t-chart using process capability index

Communications in Statistics - Simulation and Computation, 2017
Control charts play a vital role to enhance the efficiency of the manufacturing process. In many situations, the quality characteristic of interest to be monitored follows a non-normal distribution...
Aslam, Muhammad   +2 more
openaire   +2 more sources

Bootstrap confidence intervals of process capability index Spmk using different methods of estimation

Journal of Statistical Computation and Simulation, 2019
In this article, we propose eight different methods of estimation to estimate the unknown parameters and the PCI Spmk for the log-logistic distribution from the frequentist point of view.
S. Dey, Mahendra Saha
semanticscholar   +1 more source

Viability and capability indexes for multiresponse processes

Journal of Applied Statistics, 1998
The viability index Vr is introduced as an intuitively appealing measure of the capability potential of a process. It is related to the well-known index Cp but has some advantages over it. The statistical properties of Vr are readily obtainable and, unlike Cp, it extends naturally to multi-response processes.
openaire   +1 more source

New generalization of process capability index Cpk

Journal of Applied Statistics, 1998
Summary The process capability index Cpk has been widely used in manufacturing industry to provide numerical measures of process potential and performance. As noted by many quality control researchers and practitioners, Cpk is yield-based and is independent of the target T.
openaire   +1 more source

A mixed control chart using process capability index

Sequential Analysis, 2017
ABSTRACTControl charts are considered as a compulsory tool for the monitoring and improvement of the quality of products. The commonly used attribute and the variable control charts are unsatisfactory for process monitoring. To overcome this difficulty, we proposed a monitoring scheme that is an improved technique based on the joint merits of the ...
Aslam, M.   +4 more
openaire   +2 more sources

The cumulative distribution function of process capability index Cpm

Statistics & Probability Letters, 2000
zbMATH Open Web Interface contents unavailable due to conflicting licenses.
openaire   +2 more sources

Fitting Generalized Gaussian Distributions for Process Capability Index

2018
The design process of integrated circuits (IC) aims at a high yield as well as a good IC-performance. The distribution of measured output variables will not be standard Gaussian anymore. In fact, the corresponding probability density function has a more flat shape than in case of standard Gaussian. In order to optimize the yield one needs a statistical
Theo G. J. Beelen   +3 more
openaire   +1 more source

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