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A new t-chart using process capability index
Communications in Statistics - Simulation and Computation, 2017Control charts play a vital role to enhance the efficiency of the manufacturing process. In many situations, the quality characteristic of interest to be monitored follows a non-normal distribution...
Aslam, Muhammad +2 more
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Applied Stochastic Models in Business and Industry, 2022
To‐Cheng Wang, B. Hsu, M. Shu
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To‐Cheng Wang, B. Hsu, M. Shu
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Journal of Statistical Computation and Simulation, 2019
In this article, we propose eight different methods of estimation to estimate the unknown parameters and the PCI Spmk for the log-logistic distribution from the frequentist point of view.
S. Dey, Mahendra Saha
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In this article, we propose eight different methods of estimation to estimate the unknown parameters and the PCI Spmk for the log-logistic distribution from the frequentist point of view.
S. Dey, Mahendra Saha
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Viability and capability indexes for multiresponse processes
Journal of Applied Statistics, 1998The viability index Vr is introduced as an intuitively appealing measure of the capability potential of a process. It is related to the well-known index Cp but has some advantages over it. The statistical properties of Vr are readily obtainable and, unlike Cp, it extends naturally to multi-response processes.
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New generalization of process capability index Cpk
Journal of Applied Statistics, 1998Summary The process capability index Cpk has been widely used in manufacturing industry to provide numerical measures of process potential and performance. As noted by many quality control researchers and practitioners, Cpk is yield-based and is independent of the target T.
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A mixed control chart using process capability index
Sequential Analysis, 2017ABSTRACTControl charts are considered as a compulsory tool for the monitoring and improvement of the quality of products. The commonly used attribute and the variable control charts are unsatisfactory for process monitoring. To overcome this difficulty, we proposed a monitoring scheme that is an improved technique based on the joint merits of the ...
Aslam, M. +4 more
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A sequential test and a sequential sampling plan based on the process capability index Cpmk
Computational statistics (Zeitschrift), 2021M. Scagliarini
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The cumulative distribution function of process capability index Cpm
Statistics & Probability Letters, 2000zbMATH Open Web Interface contents unavailable due to conflicting licenses.
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Fitting Generalized Gaussian Distributions for Process Capability Index
2018The design process of integrated circuits (IC) aims at a high yield as well as a good IC-performance. The distribution of measured output variables will not be standard Gaussian anymore. In fact, the corresponding probability density function has a more flat shape than in case of standard Gaussian. In order to optimize the yield one needs a statistical
Theo G. J. Beelen +3 more
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