Results 311 to 320 of about 25,214,365 (363)
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IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2016
Y. S. Mehrabani, M. Eshghi
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Y. S. Mehrabani, M. Eshghi
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Exploiting process variation for retention induced refresh minimization on flash memory
Design, Automation and Test in Europe, 2016Yejia Di, Liang Shi, Kaijie Wu, C. Xue
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Process Variation Aware Design of Multi-Valued Spintronic Memristor-Based Memory Arrays
IEEE transactions on semiconductor manufacturing, 2016H. Mostafa, Y. Ismail
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The impact of process variation and stochastic aging in nanoscale VLSI
IEEE International Reliability Physics Symposium, 2016S. Kiamehr +7 more
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Design and process variation analysis of CNTFET-based ternary memory cells
Integr., 2016Geunho Cho, F. Lombardi
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A robust approach for process variation aware mask optimization
Design, Automation and Test in Europe, 2015Jian Kuang +2 more
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