Results 341 to 350 of about 25,214,365 (363)
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High Throughput Asynchronous NoC Design under High Process Variation
The Integration VLSI Journal, 2015Rabab Ezz-Eldin +2 more
exaly
Statistical analysis of process variation induced SRAM electromigration degradation
Fifteenth International Symposium on Quality Electronic Design, 2014Zhong Guan, M. Marek-Sadowska, S. Nassif
semanticscholar +1 more source
IEEE transactions on semiconductor manufacturing, 2014
S. Mohanty, E. Kougianos
semanticscholar +1 more source
S. Mohanty, E. Kougianos
semanticscholar +1 more source
Process-oriented tolerancing using the extended stream of variation model
Computers in Industry, 2013JOSÉ V Abellan-Nebot
exaly

