Results 181 to 190 of about 1,356,450 (345)

Machine Learning‐Driven Variability Analysis of Process Parameters for Semiconductor Manufacturing

open access: yesAdvanced Intelligent Systems, EarlyView.
This research presents a machine learning approach that integrates nonlinear variation decomposition (NLVD) with statistical techniques to quantify the contribution of individual unit processes to performance and variance of figure of merit (FoM) at the LOT level.
Sinyeong Kang   +6 more
wiley   +1 more source

University scientists' willingness to participate in public engagement: A concept explication. [PDF]

open access: yesPLoS One
Beets B   +7 more
europepmc   +1 more source

Practicing Public Scholarship

open access: yesPublic Philosophy Journal, 2018
openaire   +1 more source

O impacto da pandemia no desempenho de monitores de anatomia em processos de seleção de bolsas de uma instituição pública / The impact of the pandemic on the performance of anatomy monitors in scholarship selection processes at a public institution

open access: diamond, 2022
Yohann Pimentel Duarte   +14 more
openalex   +1 more source

Integrating Artificial Intelligence With Droplet‐Based Microfluidics: Advances, Challenges, and Emerging Opportunities

open access: yesAdvanced Intelligent Systems, EarlyView.
Droplet‐based microfluidics enables precise, high‐throughput microscale reactions but continues to face challenges in scalability, reproducibility, and data complexity. This review examines how artificial intelligence enhances droplet generation, detection, sorting, and adaptive control and discusses emerging opportunities for clinical and industrial ...
Junyan Lai   +10 more
wiley   +1 more source

Enhancing Atomic‐Resolution in Electron Microscopy: A Deep Learning Denoiser Operating in the Frequency Domain

open access: yesAdvanced Intelligent Systems, EarlyView.
The newly developed AI‐automated Fast Fourier Transform denoising algorithm surpasses conventional real‐space methods by revealing even light atoms otherwise hidden in noisy backgrounds. Atomic resolution electron microscopy has become an essential tool for many scientific fields, when direct visualization of atomic arrangements and defects is needed ...
Ivan Pinto‐Huguet   +8 more
wiley   +1 more source

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