Results 231 to 240 of about 1,140,380 (316)
Repeated quantum error correction on a continuously encoded qubit by real-time feedback. [PDF]
Cramer J+8 more
europepmc +1 more source
This work presents a systematic review of atmospheric turbulence fundamentals, including theoretical formulations and adaptive optics‐based mitigation strategies. This includes an in‐depth examination of the devices, theories, and methodologies associated with traditional correction approaches.
Qinghui Liu+5 more
wiley +1 more source
Robustness of operator quantum error correction with respect to initialization errors [PDF]
Ognyan Oreshkov
openalex +1 more source
Precipitated PA11 powders for laser powder bed fusion are additivated with small amounts of carbon black nanoparticles on and in the particles. The position of the nanoparticles has a strong impact on dispersion, crystallization, and thermal oxidation.
Alexander Sommereyns+4 more
wiley +1 more source
Operator quantum error correction for continuous dynamics [PDF]
Ognyan Oreshkov+2 more
openalex +1 more source
Microfabrication using nano‐ to micron‐sized blocks has transformative potential for next‐gen electronics, optoelectronics, and materials. Traditional methods are limited by scalability and precision. STIC, a single‐laser system for precise colloid manipulation and immobilization using femtosecond lasers, is introduced that enables efficient 3D ...
Krishangi Krishna+4 more
wiley +1 more source
Optical wireless communications (OWCs) provide a promising alternative to spectrum‐congested microwave wireless communications. Recently, the use of metasurfaces with sub‐wavelength features for dynamic beam steering, beam manipulation, and spatial or optical‐angular‐momentum mode generation, conversion, and multiplexing in OWCs is proposed and ...
Ke Wang+7 more
wiley +1 more source
Comment on "Operator Quantum Error Correction"
Gerald Gilbert+3 more
openalex +2 more sources
QUANTUM ERROR-CORRECTION FOR SPATIALLY CORRELATED ERRORS [PDF]
Toshihico Arimitsu+3 more
openalex +1 more source
High‐Throughput Single‐Nanowire Optoelectronic Characterization Using Microfluidic Technology
An ultrathin microfluidic platform enables high‐throughput, in‐line single particle characterization of semiconductor nanowires. Using correlative spectroscopy and imaging, analysis at 240 nanowires per minute, uncovering previously hidden details about intra‐wire disorder and inter‐wire inhomogeneity, is achieved.
Tharaka MDS Weeraddana+5 more
wiley +1 more source