Results 181 to 190 of about 175,685 (330)

Towards Defect Phase Diagrams: From Research Data Management to Automated Workflows

Advanced Engineering Materials, EarlyView.
A research data management infrastructure is presented for the systematic integration of heterogeneous experimental and simulation data required for defect phase diagrams. The approach combines openBIS with a companion application for large‐object storage, automated metadata extraction, provenance tracking and federated data access, thereby supporting ...
Khalil Rejiba, Sang‐Hyeok Lee, Christina Gasper, Martina Freund, Sandra Korte‐Kerzel, Ulrich Kerzel   +5 more
wiley   +1 more source

Visualizing Relaxation in Wearables: Multi-Domain Feature Fusion of HRV Using Fuzzy Recurrence Plots. [PDF]

Sensors (Basel)
Arya P, Singh M, Singh M.
europepmc   +1 more source

PASTA‐ELN: Simplifying Research Data Management for Experimental Materials Science

Advanced Engineering Materials, EarlyView.
Research data management faces ongoing hurdles as many ELNs remain complex and restrictive. PASTA‐ELN offers an open‐source, cross‐platform solution that prioritizes simplicity, offline access, and user control. Its in tuitive folder structure, modular Python add‐ons, and open formats enable seamless documentation, FAIR data practices, and easy ...
S. Brinckmann, G. Winkens, R. Schwaiger
wiley   +1 more source

Recurrence Plots from Altimetry Data of Some Lakes in Africa

, 2014
Amelia Carolina Sparavigna
openalex   +2 more sources

High‐Temperature Nanoindentation of Metals: Assessing Thermal Drift, Frame Compliance, and Chemical Composition Effects on the Reported Mechanical Properties

Advanced Engineering Materials, EarlyView.
Do not let thermal drift and instrument artifacts deceive high‐temperature nanoindentation results. We compare classical Oliver–Pharr and automatic image recognition analyses across steels and a Ni alloy to quantify these effects. Accounting for artifacts reveals systematic softening with temperature, while Cr and Ni additions boost resistance ...
Velislava Yonkova, Steffen Brinckmann, Ruth Schwaiger   +2 more
wiley   +1 more source

Recurrence plots for quantifying the vegetation indices dynamics in a semi-arid grassland

, 2021
Andrés F. Almeida-Ñauñay, R. M. Benito, Miguel Quemada, Juan Carlos Losada, Ana M. Tarquís   +4 more
openalex   +1 more source

All‐in‐One Analog AI Hardware: On‐Chip Training and Inference with Conductive‐Metal‐Oxide/HfOx ReRAM Devices

Advanced Functional Materials, EarlyView.
An all‐in‐one analog AI accelerator is presented, enabling on‐chip training, weight retention, and long‐term inference acceleration. It leverages a BEOL‐integrated CMO/HfOx ReRAM array with low‐voltage operation (<1.5 V), multi‐bit capability over 32 states, low programming noise (10 nS), and near‐ideal weight transfer.
Donato Francesco Falcone, Victoria Clerico, Wooseok Choi, Tommaso Stecconi, Folkert Horst, Laura Bégon‐Lours, Matteo Galetta, Antonio La Porta, Nikhil Garg, Fabien Alibart, Bert Jan Offrein, Valeria Bragaglia   +11 more
wiley   +1 more source

Quantification of Order Patterns Recurrence Plots of Event Related Potentials

, 2007
Norbert Marwan, Andreas Groth, Jürgen Kurths   +2 more
openalex   +1 more source

Recurrence plot and convolutional neural network-based signal quality assessment method for using photoplethysmogram in mobile environment (Preprint)

, 2020
Hang‐Sik Shin
openalex   +1 more source

Analytical description of Recurrence Plots of white noise and chaotic processes [PDF]

, 2003
Marko Thiel, M. Carmen Romano, Jürgen Kurths   +2 more
openalex   +1 more source