Results 281 to 282 of about 14,554 (282)

Contactless in-situ Measurements of Carrier Concentration on GaAs Surfaces by Reflectance Anisotropy Spectroscopy

, 2002
Markus Pristovsek, Shiro Tsukamoto
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[Study on in-plane optical anisotropy of semiconductor materials by reflectance difference spectroscopy].

, 2006
Lei Zhao, Yonghai Chen, Yuhua Zuo, Hai-Ning Wang, Wenhua Shi   +4 more
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