Structural dynamics at surfaces by ultrafast reflection high-energy electron diffraction [PDF]
Many fundamental processes of structural changes at surfaces occur on a pico- or femtosecond timescale. In order to study such ultrafast processes, we have combined modern surface science techniques with fs-laser pulses in a pump–probe scheme.
Michael Horn-von Hoegen
doaj +8 more sources
Reflection High-Energy Electron Diffraction oscillations during epitaxial growth of artificially layered films of (BaCuOx)m /(CaCuO2)n [PDF]
Pulsed Laser Deposition in molecular-beam epitaxy environment (Laser-MBE) has been used to grow high quality BaCuOx/CaCuO2 superlattices. In situ Reflection High Energy Electron Diffraction (RHEED) shows that the growth mechanism is 2-dimensional. Furthermore, weak but reproducible RHEED intensity oscillations have been monitored during the growth.
Balestrino, G.+8 more
arxiv +7 more sources
sim-trhepd-rheed -- Open-source simulator of total-reflection high-energy positron diffraction (TRHEPD) and reflection high-energy electron diffraction (RHEED) [PDF]
The present paper reports sim-trhepd-rheed (STR), an open-source simulator of total-reflection high-energy positron diffraction (TRHEPD) and reflection high-energy electron diffraction (RHEED) experiments which are used for atom-scale surface structure determination of a material.
Takashi Hanada+3 more
arxiv +7 more sources
Ultrafast time resolved reflection high energy electron diffraction with tilted pump pulse fronts [PDF]
We present time-resolved RHEED from a laser excited Pb(111) surface using a pulse front tilter for the compensation of the velocity mismatch of electrons and light.
Bovensiepen U.+10 more
doaj +2 more sources
Comparison of azimuthal plots for reflection high-energy positron diffraction (RHEPD) and reflection high-energy electron diffraction (RHEED) for Si(111) surface. [PDF]
Azimuthal plots for RHEPD (reflection high-energy positron diffraction) and RHEED (reflection high-energy electron diffraction) were calculated using dynamical diffraction theory and then compared. It was assumed that RHEPD and RHEED azimuthal plots can be collected practically by recording the intensity while rotating the sample around the axis ...
Mitura Z.
europepmc +5 more sources
Single-Shot Electron Diffraction using a Cold Atom Electron Source [PDF]
Cold atom electron sources are a promising alternative to traditional photocathode sources for use in ultrafast electron diffraction due to greatly reduced electron temperature at creation, and the potential for a corresponding increase in brightness. Here we demonstrate single-shot, nanosecond electron diffraction from monocrystalline gold using cold ...
McCulloch, Andrew J.+5 more
arxiv +5 more sources
Pulsed laser deposition assisted epitaxial growth of cesium telluride photocathodes for high brightness electron sources [PDF]
The development of high-brightness electron sources is critical to state-of-the-art electron accelerator applications like X-ray free electron laser (XFEL) and ultra-fast electron microscopy. Cesium telluride is chosen as the electron source material for
Kali Prasanna Mondal+13 more
doaj +2 more sources
Growth of strontium ruthenate films by hybrid molecular beam epitaxy
We report on the growth of epitaxial Sr2RuO4 films using a hybrid molecular beam epitaxy approach in which a volatile precursor containing RuO4 is used to supply ruthenium and oxygen.
Patrick B. Marshall+3 more
doaj +3 more sources
Practice of the Analysis of Reflection High-Energy Electron Diffraction Pattern
Analyses and assignments of reflection high-energy electron diffraction patterns of Si(100) surfaces are demonstrated for the practice. Several check points for the RHEED analysis are described.
Tomohide Takami
openalex +3 more sources
GARFIELD, a toolkit for interpreting ultrafast electron diffraction data of imperfect quasi-single crystals. [PDF]
The analysis of ultrafast electron diffraction (UED) data from low-symmetry single crystals of small molecules is often challenged by the difficulty of assigning unique Laue indices to the observed Bragg reflections. For a variety of technical and physical reasons, UED diffraction images are typically of lower quality when viewed from the perspective ...
Marx A, Epp SW.
europepmc +2 more sources