Growth of strontium ruthenate films by hybrid molecular beam epitaxy
APL Materials, 2017 We report on the growth of epitaxial Sr2RuO4 films using a hybrid molecular beam epitaxy approach in which a volatile precursor containing RuO4 is used to supply ruthenium and oxygen.
Patrick B. Marshall +3 more
doaj +3 more sources
Reflection High-Energy Electron Diffraction oscillations during epitaxial growth of artificially layered films of (BaCuOx)m /(CaCuO2)n [PDF]
, 2000 Pulsed Laser Deposition in molecular-beam epitaxy environment (Laser-MBE) has been used to grow high quality BaCuOx/CaCuO2 superlattices. In situ Reflection High Energy Electron Diffraction (RHEED) shows that the growth mechanism is 2-dimensional ...
G. Balestrino +8 more
openalex +3 more sources
Reflection high-energy electron diffraction analysis of polycrystalline films with grain size and orientation distributions [PDF]
, 2002 We report a computationally efficient algorithm to calculate reflection high-energy electron diffraction (RHEED) intensities from well-textured, small-grained polycrystalline films in the kinematic limit.
John W. Hartman +2 more
openalex +4 more sources
Reflection electron energy loss spectroscopy during initial stages of Ge growth on Si by molecular beam epitaxy [PDF]
, 1991 Using a conventional reflection high-energy electron diffraction gun together with an electron energy loss spectrometer, we have combined in situ measurements of inelastic scattering intensities from Si L2,3 and Ge L2,3 core losses with reflection ...
Ahn, Channing C., Atwater, Harry A.
core +1 more source
Local order measurement in SnGe alloys and monolayer Sn films on Si with reflection electron energy loss spectrometry [PDF]
, 1995 Measurements of local order are demonstrated in Sn-containing alloys and epitaxial monolayer thickness films by analysis of extended-edge energy loss fine structure (EXELFS) data obtained by reflection electron energy loss spectrometry (REELS).
Ahn, Channing C. +4 more
core +1 more source
Complex oxide growth using simultaneous in situ reflection high-energy electron diffraction and x-ray reflectivity: When is one layer complete? [PDF]
, 2014 During layer-by-layer homoepitaxial growth, both the Reflection High-Energy Electron Diffraction (RHEED) intensity and the x-ray reflection intensity will oscillate, and each complete oscillation indicates the addition of one monolayer of material ...
M. C.Sullivan +6 more
semanticscholar +1 more source
Magnetic and electromagnetic properties of Fe/Fe2–3N composites prepared by high-energy ball milling
Journal of Materials Research and Technology, 2020 In this study, high-energy ball milling processes were adopted to prepare Fe/Fe2–3N composites. The phase composition and microstructure of the composites were characterized by X-ray diffraction, scanning electron microscopy and high-resolution ...
Mengying Gong +5 more
doaj +1 more source
Single-Shot Electron Diffraction using a Cold Atom Electron Source [PDF]
, 2015 Cold atom electron sources are a promising alternative to traditional photocathode sources for use in ultrafast electron diffraction due to greatly reduced electron temperature at creation, and the potential for a corresponding increase in brightness ...
McCulloch, Andrew J. +5 more
core +2 more sources
Ozone detection by means of semiconductor gas sensors based on palladium (II) oxide
Конденсированные среды и межфазные границы, 2021 Thin film semiconductor sensors based on palladium oxide were produced to analyse the concentration of ozone in the air. The palladium oxide films were obtained by means of thermal oxidation of ~ 20-30 nm metal in air at various temperatures.
Stanislav V. Ryabtsev +5 more
doaj +1 more source
Rocksalt MgS solar blind ultra-violet detectors
AIP Advances, 2012 Studies using in-situ Auger electron spectroscopy and reflection high energy electron diffraction, and ex-situ high resolution X-ray diffraction and electron backscatter diffraction reveal that a MgS thin film grown directly on a GaAs (100) substrate by ...
Ying-Hoi Lai +6 more
doaj +1 more source