Results 311 to 320 of about 468,062 (374)

Reflection High-Energy Electron Diffraction

, 2019
In this paper, we present an overview of the diffraction technique known as reflection highenergy electron diffraction (RHEED). We discuss an elementary approach behind the analysis of experimentally obtained RHEED patterns (including patterns we ...
Nassim Derriche, S. Godin, Rysa Greenwood, A. Mercado, A. Warner   +4 more
semanticscholar   +1 more source

Reflection High-Energy Electron Diffraction

, 2012
The fundamentals, experimental techniques, and practical aspects of reflection high-energy electron diffraction (RHEED) are described with some examples of observations.
S. Hasegawa
semanticscholar   +1 more source

An accurate dynamical electron diffraction algorithm for reflection high-energy electron diffraction

Philosophical Magazine, 2015
The conventional multislice method (CMS) method, one of the most popular dynamical electron diffraction calculation procedures in transmission electron microscopy, was introduced to calculate reflection high-energy electron diffraction (RHEED) as it is well adapted to deal with the deviations from the periodicity in the direction parallel to the ...
G.W. Zhou, C.L. Lv, Y.G. Wang, Jian Yu Huang, C.Y. Cai   +4 more
openaire   +2 more sources

Reflection high-energy electron diffraction from carbon nanotubes [PDF]

Physical Review B, 2001
Using reflection high-energy electron diffraction, we have observed diffraction patterns from both vertically aligned and randomly oriented multiwalled carbon nanotube samples. The patterns, for both samples, consist of rings and are similar to the patterns observed in x-ray diffraction from multiwalled carbon nanotubes.
P. M. Ajayan, Ganpati Ramanath, Bingqing Wei, Jason T. Drotar, Yiping Zhao, Toh-Ming Lu, Gwo-Ching Wang   +6 more
openaire   +1 more source

Big-data reflection high energy electron diffraction analysis for understanding epitaxial film growth processes.

ACS Nano, 2014
Reflection high energy electron diffraction (RHEED) has by now become a standard tool for in situ monitoring of film growth by pulsed laser deposition and molecular beam epitaxy.
R. Vasudevan, A. Tselev, A. Baddorf, Sergei V. Kalinin   +3 more
semanticscholar   +1 more source

Weissenberg Reflection High-Energy Electron Diffraction for Surface Crystallography

Physical Review Letters, 2006
The principle of a Weissenberg camera is applied to surface crystallographic analysis by reflection high-energy electron diffraction. By removing inelastic electrons and measuring hundreds of patterns as a function of sample rotation angle phi, kinematical analysis can be performed over a large volume of reciprocal space.
Tomoyuki Yamazaki, Tadashi Abukawa, Koji Yoshimura, Kentaro Yajima   +3 more
openaire   +3 more sources

Analysis of reflection high energy electron diffraction azimuthal plots

Physical Review Letters, 1993
Reflection high energy electron diffraction data collected in the form of an azimuthal plot are analyzed theoretically for the first time. Experimental results for Si(111) at a glancing angle satisfying a Bragg condition are taken from the literature. Calculations are carried out within a multiple scattering approach.
Mitura, Z, Maksym, PA
openaire   +4 more sources

Reflection high‐energy electron diffraction oscillations from vicinal surfaces—a new approach to surface diffusion measurements

, 1985
A simple extension of the reflection high‐energy electron diffraction oscillation technique to vicinal surfaces provides a means of studying surface diffusion during molecular beam epitaxial growth.
J. Neave, P. Dobson, B. Joyce, J. Zhang
semanticscholar   +1 more source

Theory of reflection high-energy electron diffraction

Physical Review B, 1990
We present a new scheme to calculate reflection high-energy electron-diffraction rocking curves based on the technique to solve coupled second-order differential equations developed by Magnus and others. Furthermore, a layer-doubling method, which was originally developed for the low-energy electron diffraction, is incorporated into this scheme very ...
openaire   +3 more sources

Inelastic electron analysis in reflection high-energy electron diffraction condition

Applied Surface Science, 2003
Abstract Electron energy loss spectra (EELS) has been measured under reflection high-energy electron diffraction (RHEED) condition using a newly developed energy filtered RHEED measurement system to investigate incident and exit angle dependence of plasmon excitation process. As a specimen, clean Si(1 1 1)7×7 surface is used.
Hitoshi Nakahara, T. Hishida, Ayahiko Ichimiya   +2 more
openaire   +2 more sources