Results 141 to 150 of about 6,842 (203)

Advances in detection for neutron reflectometry with time-resolved imaging detectors. [PDF]

Sci Rep
Khaplanov A, Ankner JF, Hirsh TY, Losko AS, Long AM, Loyd M, Sykora GJ, Vogel SC, Watkins EB, Wolfertz A.   +9 more
europepmc   +1 more source

Harnessing Membrane-Active Peptides for Selective Cancer Targeting: Phosphatidylserine Recognition by Tilapia Piscidin 4. [PDF]

JACS Au
Makambi WK, De S, Li D, Mondal K, Mitchell ME, Kaur N, Watkins E, Heinrich F, Hoogerheide DP, Klauda JB, Rudloff U, Cotten ML, Mihailescu M.   +12 more
europepmc   +1 more source

High-Efficiency Fiber Edge Coupling for Silicon Nitride Integrated Photonics. [PDF]

Micromachines (Basel)
Avdeev SS, Baburin AS, Sergeev EV, Kramarenko AB, Belyaev AV, Kushnev DV, Buzaverov KA, Stepanov IA, Echeistov VV, Loginov AS, Bukatin SV, Amiraslanov AS, Lotkov ES, Baklykov DA, Rodionov IA.   +14 more
europepmc   +1 more source

GNSS hydrology: Defining a new interdiscipline integrating GNSS hydrogeodesy and remote sensing. [PDF]

Innovation (Camb)
Wan W, Guo Z, Karegar MA, Tang G, Larson KM.   +4 more
europepmc   +1 more source

Hybrid-Mechanism Distributed Sensing Using Forward Transmission and Optical Frequency-Domain Reflectometry. [PDF]

Sensors (Basel)
Dai S, Zhong H, Rao X, Liu J, Fu C, Wang Y, Chen GY.   +6 more
europepmc   +1 more source

Some of the next articles are maybe not open access.

Related searches:

Passive Reflectometry

2008
Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for measuring reflectance are cumbersome, however, and although the process can be streamlined using cameras, projectors and clever catadioptrics, it generally requires complex infrastructure.
Fabiano Romeiro, Yuriy Vasilyev, Todd E. Zickler   +2 more
openaire   +1 more source

Imaging reflectometry in situ

Applied Optics, 2007
An innovative method of in situ real-time optical monitoring of thin film deposition and etching is presented. In this technique, intensity maps of a thin film corresponding to a series of wavelengths selected by a monochromator (300-800 nm) are recorded by a CCD camera.
Michal, Urbánek, Jirí I, Spousta, Tomás, Behounek, Tomás, Sikola   +3 more
openaire   +2 more sources

Submillimeter optical reflectometry

Journal of Lightwave Technology, 1989
The development of optical reflectometers with a spatial resolution in the submillimeter range is reviewed. Optical time-domain reflectometers (OTDRs) and optical low-coherence reflectometers (OLCRs) for nondestructive diagnostics of waveguide devices are discussed.
Gilgen, H. H., Novak, R. P., Salathe, R. P., Hodel, W., Beaud, P.   +4 more
openaire   +2 more sources