Results 221 to 230 of about 53,100 (266)

Highly Selective Polyelectrolyte Multilayer Membranes Through Hydrophobic Interactions. [PDF]

ACS Appl Mater Interfaces
Jonkers WA, Precheur M, Andrade JR, de Vos WM, Te Brinke E.   +4 more
europepmc   +1 more source

Kinetics of Macroion Adsorption on Silica: Complementary Theoretical and Experimental Investigations for Poly-l-arginine. [PDF]

Langmuir
Morga M, Kosior D, Nattich-Rak M, Leszczyńska I, Batys P, Adamczyk Z, Leshansky AM.   +6 more
europepmc   +1 more source

Track Deflection Monitoring for Railway Construction Based on Dynamic Brillouin Optical Time-Domain Reflectometry. [PDF]

Sensors (Basel)
Zhang T, Zhou L, Liu W, Cheng L.
europepmc   +1 more source

Neutron Reflectometry Study on the Interfacial Layer of Epoxy Resin To Improve Adhesion Strength. [PDF]

ACS Appl Mater Interfaces
Liu Y, Miyata N, Miyazaki T, Shundo A, Kawaguchi D, Tanaka K, Aoki H.   +6 more
europepmc   +1 more source

Integrated porosity estimation of partially saturated sand-hematite mixtures using electrical resistivity and elastic wave velocity. [PDF]

Sci Rep
Lee JS, Kang HS, Lee D, Kim SY.
europepmc   +1 more source

Immediate Effects of Goldmann Applanation Tonometry on Central Corneal Thickness Measurements Using Contact and Non-contact Pachymetry Methods. [PDF]

Cureus
Sibia AS, Banoub RG, Eaddy I, Cheng A, Kubal A, Gupta S, Chalam KV.   +6 more
europepmc   +1 more source

Tecnology of the time domain reflectometry for measuring the soil humidity

, 2001
S.M. Pereira
openalex   +1 more source

X-Ray Reflectometry

, 2021
openaire   +1 more source

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Pocket reflectometry

ACM SIGGRAPH 2011 papers, 2011
We present a simple, fast solution for reflectance acquisition using tools that fit into a pocket. Our method captures video of a flat target surface from a fixed video camera lit by a hand-held, moving, linear light source. After processing, we obtain an SVBRDF.
Peiran Ren, Jiaping Wang, John Snyder, Xin Tong, Baining Guo   +4 more
openaire   +1 more source

Variable distance absolute reflectometry

Journal of the Optical Society of America A, 2012
In many interferometric applications the variation of the reflected light intensity due to the separation distance change between two optical systems is the raw signal from which some unknown parameters must be determined. We consider the general situation in which the signal offset and amplification, the initial separation, and the optical properties ...
Stoyan C, Russev, Gichka G, Tsutsumanova, Atanas N, Tzonev   +2 more
openaire   +2 more sources