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2014
Neutron (and X-ray) reflectometry constitute complementary interfacially sensitive techniques that open access to studying the structure within thin films of both soft and hard condensed matter. Film thickness starts oxide surfaces on bulk substrates, proceeding to (pauci-)molecular layers and up to hundreds of nanometers. Thickness resolution for flat
openaire +1 more source
Neutron (and X-ray) reflectometry constitute complementary interfacially sensitive techniques that open access to studying the structure within thin films of both soft and hard condensed matter. Film thickness starts oxide surfaces on bulk substrates, proceeding to (pauci-)molecular layers and up to hundreds of nanometers. Thickness resolution for flat
openaire +1 more source
Interferometric optical time-domain reflectometry for distributed optical-fiber sensing
Applied Optics, 1998Alan J Rogers, S V Shatalin, A J Rogers
exaly
An evaluation of acoustic reflectometry for leakage and blockage detection
Proceedings of the Institution of Mechanical Engineers, Part C: Journal of Mechanical Engineering Science, 2008Barry Lennox, J T Turner
exaly