Results 291 to 300 of about 493,705 (320)

Machine Learning‐Based Standard Compact Model Binning Parameter Extraction Methodology for Integrated Circuit Design of Next‐Generation Semiconductor Devices

open access: yesAdvanced Intelligent Systems, EarlyView.
This study presents a neural network‐based methodology for Berkeley Short‐Channel IGFET Model–Common Multi‐Gate parameter extraction of gate‐all‐around field effect transistors, integrating binning adaptive sampling and transformer neural networks to efficiently capture current–voltage and capacitance–voltage characteristics.
Jaeweon Kang   +4 more
wiley   +1 more source

Partial correlation as a tool for mapping functional-structural correspondence in human brain connectivity. [PDF]

open access: yesNetw Neurosci
Santucci F   +6 more
europepmc   +1 more source

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