Results 11 to 20 of about 1,661,356 (249)
Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET
IEEE Access, 2020 The negative bias temperature instability (NBTI) mechanisms for Core and input/output (I/O) devices from a 130 nm partially-depleted silicon on insulator (PDSOI) technology are investigated.
Chao Peng +6 more
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A TRL Assessment Method Considering Reliability Requirements
MATEC Web of Conferences, 2018 In addition to considering the functional performance characteristics requirements of the product, reliability requirements should be also considered in the current product design.
Wang Wei +5 more
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IEEE Access, 2017 Due to time and cost limitations, multi-stress accelerated life tests (ALTs) have been gradually applied in the fields of experimental design and reliability estimation for highly reliable and long-life products.
Yunxia Chen, Wenbin Sun, Dan Xu
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Reliability Implementation and Cost Trade-off of Product during the Development Process
MATEC Web of Conferences, 2018 Modern product needs to meet the reliability requirements during the development process. The reliability in this paper refers to an integral view of a product’s reliability, maintainability, supportability, testability, safety and environmental ...
Wang Wei +5 more
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Status Set Sequential Pattern Mining Considering Time Windows and Periodic Analysis of Patterns
Entropy, 2021 The traditional sequential pattern mining method is carried out considering the whole time period and often ignores the sequential patterns that only occur in local time windows, as well as possible periodicity.
Shenghan Zhou +7 more
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Influence of the Acceptor-Type Trap on the Threshold Voltage of the Short-Channel GaN MOS-HEMT
IEEE Journal of the Electron Devices Society, 2021 In this work, the influence of the acceptor-type trap on the threshold voltage and short-channel effect is analyzed and modeled for the short-channel GaN MOS-HEMT. Particularly, the analysis and modeling are carried out with the dependences of the traps&#
Yijun Shi +4 more
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Reliability Model of Consecutive $(2, k)$ -Out-of-( $2, n$ ) :F Systems With Local Load-Sharing
IEEE Access, 2018 Most previous reliability models of consecutive k-out-of-n system assume that the components are independent or their reliabilities are equal. The system reliability can be obtained according to the configuration of k consecutive failed components ...
Jianbin Guo +3 more
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Degradation dynamics of quantum dots in white LED applications
Scientific Reports, 2021 Quantum Dots (QDs) are being investigated in a hybrid white light LED structure which inculcates phosphor in the package with a blue LED chip as the light source recently.
Hsiao-Chien Chen +4 more
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A Novel Model-Based Dynamic Analysis Method for State Correlation With IMA Fault Recovery
IEEE Access, 2018 Integrated modular avionics (IMA) systems present many advantages. However, the resource sharing mechanism also brings a series of system problems, including the frequency of fault propagation and the difficulties of system design verification.
Rongbin Han +4 more
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IEEE Access, 2017 Degradation modeling and remaining useful life (RUL) prediction for products with multiple degradation features are hot topics in the prognostic and health management.
Fuqiang Sun +3 more
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