Results 11 to 20 of about 1,633,391 (296)
Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET
The negative bias temperature instability (NBTI) mechanisms for Core and input/output (I/O) devices from a 130 nm partially-depleted silicon on insulator (PDSOI) technology are investigated.
Chao Peng +6 more
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To reveal the effect of vein-bionic surface textures on the tribological behavior of cylindrical roller thrust bearings (CRTBs) under starved lubrication, six kinds of leaves (Forsythia, Clausena lansiu, Ash, Purple leaf plum, Pipal and Apricot) were ...
Risheng Long +4 more
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Reliability of reliability coefficients in the estimation of asymmetry [PDF]
AbstractAlthough promising to provide insight into the interaction between genotype and environment, investigations into fluctuating asymmetry suffer from a lack of standardization in the reporting of measurement error. In the present paper we show, using both anthropometric and odonto‐metric data, that the use of the reliability coefficient calculated
Fields, S. J. +3 more
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Due to time and cost limitations, multi-stress accelerated life tests (ALTs) have been gradually applied in the fields of experimental design and reliability estimation for highly reliable and long-life products.
Yunxia Chen, Wenbin Sun, Dan Xu
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Quantum technology has led to increasingly sophisticated and complex quantum devices. Assessing their reliability (quantum reliability) is an important issue. Although reliability theory for classical devices has been well developed in industry and technology, a suitable metric on quantum reliability and its loss has not been systematically ...
Cui, L. X., Du, Y-M., Sun, C. P.
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A TRL Assessment Method Considering Reliability Requirements
In addition to considering the functional performance characteristics requirements of the product, reliability requirements should be also considered in the current product design.
Wang Wei +5 more
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Reliability Implementation and Cost Trade-off of Product during the Development Process
Modern product needs to meet the reliability requirements during the development process. The reliability in this paper refers to an integral view of a product’s reliability, maintainability, supportability, testability, safety and environmental ...
Wang Wei +5 more
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Influence of the Acceptor-Type Trap on the Threshold Voltage of the Short-Channel GaN MOS-HEMT
In this work, the influence of the acceptor-type trap on the threshold voltage and short-channel effect is analyzed and modeled for the short-channel GaN MOS-HEMT. Particularly, the analysis and modeling are carried out with the dependences of the traps
Yijun Shi +4 more
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Reliability Model of Consecutive $(2, k)$ -Out-of-( $2, n$ ) :F Systems With Local Load-Sharing
Most previous reliability models of consecutive k-out-of-n system assume that the components are independent or their reliabilities are equal. The system reliability can be obtained according to the configuration of k consecutive failed components ...
Jianbin Guo +3 more
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Status Set Sequential Pattern Mining Considering Time Windows and Periodic Analysis of Patterns
The traditional sequential pattern mining method is carried out considering the whole time period and often ignores the sequential patterns that only occur in local time windows, as well as possible periodicity.
Shenghan Zhou +7 more
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