Results 11 to 20 of about 2,821,697 (256)
Empirical bayes estimates of development reliability for one shot devices [PDF]
This article describes a method for estimating the reliability of a system under development that is an evolution of previous designs. We present an approach to making effective use of heritage data from similar operational systems to estimate ...
Quigley, J.L. +2 more
core +3 more sources
Reliability approach for safe designing on a locking system [PDF]
The aim of this work is to predict the failure probability of a locking system. This failure probability is assessed using complementary methods: the First-Order Reliability Method (FORM) and Second-Order Reliability Method (SORM) as approximated methods,
ARNOUX, Philippe +3 more
core +1 more source
Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET
The negative bias temperature instability (NBTI) mechanisms for Core and input/output (I/O) devices from a 130 nm partially-depleted silicon on insulator (PDSOI) technology are investigated.
Chao Peng +6 more
doaj +1 more source
Cost-benefit modelling for reliability growth [PDF]
Decisions during the reliability growth development process of engineering equipment involve trade-offs between cost and risk. However slight, there exists a chance an item of equipment will not function as planned during its specified life. Consequently
Quigley, J.L., Walls, L.A.
core +5 more sources
A TRL Assessment Method Considering Reliability Requirements
In addition to considering the functional performance characteristics requirements of the product, reliability requirements should be also considered in the current product design.
Wang Wei +5 more
doaj +1 more source
Due to time and cost limitations, multi-stress accelerated life tests (ALTs) have been gradually applied in the fields of experimental design and reliability estimation for highly reliable and long-life products.
Yunxia Chen, Wenbin Sun, Dan Xu
doaj +1 more source
Reliability Implementation and Cost Trade-off of Product during the Development Process
Modern product needs to meet the reliability requirements during the development process. The reliability in this paper refers to an integral view of a product’s reliability, maintainability, supportability, testability, safety and environmental ...
Wang Wei +5 more
doaj +1 more source
Influence of the Acceptor-Type Trap on the Threshold Voltage of the Short-Channel GaN MOS-HEMT
In this work, the influence of the acceptor-type trap on the threshold voltage and short-channel effect is analyzed and modeled for the short-channel GaN MOS-HEMT. Particularly, the analysis and modeling are carried out with the dependences of the traps
Yijun Shi +4 more
doaj +1 more source
Sheet Molding Compound Automotive Component Reliability Using a Micromechanical Damage Approach [PDF]
The mastering of product reliability is essential for industrial competitiveness. If for metallic materials the topic is well-known, especially in automotive industry, Original Equipment Manufacturers are expecting strong support of their suppliers to ...
SHIRINBAYAN, Mohammadali +8 more
core +1 more source
Status Set Sequential Pattern Mining Considering Time Windows and Periodic Analysis of Patterns
The traditional sequential pattern mining method is carried out considering the whole time period and often ignores the sequential patterns that only occur in local time windows, as well as possible periodicity.
Shenghan Zhou +7 more
doaj +1 more source

