Results 11 to 20 of about 2,821,697 (256)

Empirical bayes estimates of development reliability for one shot devices [PDF]

open access: yes, 2009
This article describes a method for estimating the reliability of a system under development that is an evolution of previous designs. We present an approach to making effective use of heritage data from similar operational systems to estimate ...
Quigley, J.L.   +2 more
core   +3 more sources

Reliability approach for safe designing on a locking system [PDF]

open access: yes, 2010
The aim of this work is to predict the failure probability of a locking system. This failure probability is assessed using complementary methods: the First-Order Reliability Method (FORM) and Second-Order Reliability Method (SORM) as approximated methods,
ARNOUX, Philippe   +3 more
core   +1 more source

Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET

open access: yesIEEE Access, 2020
The negative bias temperature instability (NBTI) mechanisms for Core and input/output (I/O) devices from a 130 nm partially-depleted silicon on insulator (PDSOI) technology are investigated.
Chao Peng   +6 more
doaj   +1 more source

Cost-benefit modelling for reliability growth [PDF]

open access: yes, 2003
Decisions during the reliability growth development process of engineering equipment involve trade-offs between cost and risk. However slight, there exists a chance an item of equipment will not function as planned during its specified life. Consequently
Quigley, J.L., Walls, L.A.
core   +5 more sources

A TRL Assessment Method Considering Reliability Requirements

open access: yesMATEC Web of Conferences, 2018
In addition to considering the functional performance characteristics requirements of the product, reliability requirements should be also considered in the current product design.
Wang Wei   +5 more
doaj   +1 more source

Multi-Stress Equivalent Optimum Design for Ramp-Stress Accelerated Life Test Plans Based on D-Efficiency

open access: yesIEEE Access, 2017
Due to time and cost limitations, multi-stress accelerated life tests (ALTs) have been gradually applied in the fields of experimental design and reliability estimation for highly reliable and long-life products.
Yunxia Chen, Wenbin Sun, Dan Xu
doaj   +1 more source

Reliability Implementation and Cost Trade-off of Product during the Development Process

open access: yesMATEC Web of Conferences, 2018
Modern product needs to meet the reliability requirements during the development process. The reliability in this paper refers to an integral view of a product’s reliability, maintainability, supportability, testability, safety and environmental ...
Wang Wei   +5 more
doaj   +1 more source

Influence of the Acceptor-Type Trap on the Threshold Voltage of the Short-Channel GaN MOS-HEMT

open access: yesIEEE Journal of the Electron Devices Society, 2021
In this work, the influence of the acceptor-type trap on the threshold voltage and short-channel effect is analyzed and modeled for the short-channel GaN MOS-HEMT. Particularly, the analysis and modeling are carried out with the dependences of the traps&#
Yijun Shi   +4 more
doaj   +1 more source

Sheet Molding Compound Automotive Component Reliability Using a Micromechanical Damage Approach [PDF]

open access: yes, 2020
The mastering of product reliability is essential for industrial competitiveness. If for metallic materials the topic is well-known, especially in automotive industry, Original Equipment Manufacturers are expecting strong support of their suppliers to ...
SHIRINBAYAN, Mohammadali   +8 more
core   +1 more source

Status Set Sequential Pattern Mining Considering Time Windows and Periodic Analysis of Patterns

open access: yesEntropy, 2021
The traditional sequential pattern mining method is carried out considering the whole time period and often ignores the sequential patterns that only occur in local time windows, as well as possible periodicity.
Shenghan Zhou   +7 more
doaj   +1 more source

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