Results 201 to 210 of about 241,840 (235)

Oxide Semiconductor for Advanced Memory Architectures: Atomic Layer Deposition, Key Requirement and Challenges. [PDF]

Nanomicro Lett
Lee CH, Ryu SH, Hwang T, Kim SH, Kim YS, Park JS.   +5 more
europepmc   +1 more source

CalDiff: Calibrating Uncertainty and Accessing Reliability of Diffusion Models for Trustworthy Lesion Segmentation. [PDF]

IEEE J Biomed Health Inform
Wang X, Yang M, Tosun S, Nakamura K, Li S, Li X.   +5 more
europepmc   +1 more source

Enhanced active learning Gaussian process metamodel for estimating the one-sided tail probability of nonlinear structural response. [PDF]

Sci Rep
Wang Y, Huang Y, Huang Y, Yin W.
europepmc   +1 more source

Electric-load forecasting using interval models based on granularity and justifiable principles. [PDF]

Sci Rep
Al-Hmouz R, Mansouri M, Al-Badi A, Awad ASA, Hossen A.   +4 more
europepmc   +1 more source

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Engineering Reliability Management

IEEE Journal on Selected Areas in Communications, 1983
Abstract This paper reviews the history and the pertinent areas of reliability and maintainability management. A list of selective references on the subject is presented.
openaire   +1 more source

Engineering Reliability

Technometrics, 1999
John I. McCool, Richard E. Barlow
openaire   +2 more sources

Reliability Engineering

2005
Allan White, Hagbae Kim, Michael Pecht, Iuliana Bordelon, Carol Smidts   +4 more
  +4 more sources

Reliability Engineering

2023
openaire   +2 more sources

Reliability Engineering

Journal of Quality Technology, 1997
  +4 more sources