Results 121 to 130 of about 121,599 (302)
The conductive and stretchable photothermal CuSe fiber is fabricated for versatile biomedical applications. This CuSe fiber functions as a reliable wearable strain sensor and heater due to its high conductivity, stretchability and photothermal efficiency.
Kukro Yoon +9 more
wiley +1 more source
Research Progress on High-speed Directly Modulated Semiconductor Lasers
High speed directly modulated semiconductor laser offers high speed transmission rate with high reliability and low cost, making it a cost-effective light source choice for 5th Generation Mobile Communication Technology (5G) fronthaul and data center ...
TIAN Qi +3 more
doaj
Unlocking Photodetection Mode Switching from a Simple Lateral Design
A simple lateral 2D perovskite photodetector capable of switching among transient, continuous, and dual transient/continuous photoresponse modes is achieved by integrating photoconductive effects with capacitive coupling from the SiO2/Si substrate. Such light‐programmable photodetection mode switching enables triple‐channel information transmission and
Zijun (June) Yong +10 more
wiley +1 more source
Index to NASA Tech Briefs, January - June 1966 [PDF]
Index to NASA technological innovations for January-June ...
core +1 more source
Dielectric capacitors typically struggle to achieve both high energy storage density and high efficiency at applied voltages below 10 V. Here, we address this challenge by introducing a novel hybrid fluorite/perovskite heterostructure design that combines ultra‐high recoverable energy storage density with efficient energy release (Uf ≈ 1016 J/cm3), at ...
Ampattu R. Jayakrishnan +10 more
wiley +1 more source
Reliability of Power Semiconductor Modules: A State-of-the-Art Review
Power electronic converters are essential in modern energy systems, facilitating efficient energy conversion in applications such as renewable energy, transportation, and industry.
Eneko Agirrezabala +3 more
doaj +1 more source
Method of examining microcircuit patterns [PDF]
Examination of microstructures of LSI and VLSI devices is facilitated by employing a method in which the device is photographed through a darkfield illumination optical microscope and the resulting negative subjected to inverse processing to form a ...
Suszko, S. F.
core +1 more source
Tracing Sub‐Monolayer Contamination on Wafer‐Scale 2D Materials
Sub‐monolayer adventitious carbon contamination limits the performance and reproducibility of 2D material‐based devices. This study demonstrates scanning helium microscopy (SHeM) as a non‐destructive, ultra‐sensitive tool for wafer‐scale imaging of surface cleanliness.
Chenyang Zhao +7 more
wiley +1 more source
Review on the Thermal Models Applications in the Reliability of Power Semiconductor Device
The power semiconductor device plays a key role in energy conversion and management, and the failure of the device would make a great economic loss.
Jun Zhang +3 more
doaj +1 more source
InSb, a narrow‐bandgap semiconductor with high carrier mobility, is promising for thermoelectric energy conversion but suffers from high lattice thermal conductivity and strong bipolar conduction. Here, in situ interface engineering using Co2O3 nanoprecursors forms hierarchical CoSbx/In2O3/CoSb3 heterostructures that enhance phonon scattering and ...
Jiwu Xin +10 more
wiley +1 more source

