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Status of Compound Semiconductor Device Reliability
1990A review is made of compound semiconductor device reliability from the period 1980 to the present. Emphasis is placed on technology based on field effect transistors (FETs). Many reliability studies were made of small signal GaAs FETs in the 1970s and of GaAs power FETs in the 1980’s; a substantial reliability base exists for these devices.
W. T. Anderson, A. Christou
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Reliability considerations in the application of plastic semiconductors
1975 EIC 12th Electrical/Electronics Insulation Conference, 1975Extensive reliability evaluation of plastic encapsulated transistors and microcircuits at Fort Monmouth and by vendors and commercial users of these devices, has revealed at least three major problem areas: 1. Bond Integrity 2. Moisture Resistance 3.
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Historical review of compound semiconductor reliability
Microelectronics Reliability, 2006This discussion is meant to look back at reliability progress over the last thirty years and identify trends and shortcomings. The main body of published work came from the ROCS workshop. While the workshop addresses various specific issues individually, it is the accumulation of a variety of data, information, and experience which forms the basis of ...
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Reliability and Degradation of Semiconductor Lasers and LEDs
Journal of Modern Optics, 1992(1992). Reliability and Degradation of Semiconductor Lasers and LEDs. Journal of Modern Optics: Vol. 39, No. 8, pp. 1799-1800.
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Reliability Issue in Compound Semiconductor Heterojunction Devices
1998The failure mechanisms affecting electron devices based on compound semiconductors are reviewed.
FANTINI, Fausto +8 more
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Nuclear Methods in the Characterization of Semiconductor Reliability
1990Ion implantation is a well established technique for semiconductors doping. The annealing of the samples has, however, to be done as the following step and in many cases the results are not well understood. A survey of applications of nuclear techniques for the characterization of the structural and electronic environment of impurity atoms in ...
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Reliability Testing of Semiconductor Optical Devices
2012Reliability of semiconductor optical devices used in recent systems and equipment is described from an aspect of the degradation mechanisms observed on various reliability tests. The degradation mechanisms clarified for last three decades still govern the device reliability in recent systems and equipment.
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Enhancing global access to cancer medicines
Ca-A Cancer Journal for Clinicians, 2020Javier Cortés +2 more
exaly
The Reliability of Semiconductor Devices: An Overview
Proceedings of the 6th International Conference on Optimization of Electrical and Electronic Equipments, 2005openaire +2 more sources