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IEEE Transactions on Terahertz Science and Technology, 2019
We have developed a sideband separating receiver module for the W band (75–110 GHz) that has been designed with a scalable and compact architecture allowing easy integration into larger systems, like focal plane arrays.
D. Monasterio +5 more
semanticscholar +1 more source
We have developed a sideband separating receiver module for the W band (75–110 GHz) that has been designed with a scalable and compact architecture allowing easy integration into larger systems, like focal plane arrays.
D. Monasterio +5 more
semanticscholar +1 more source
Tax-Loss Carry Forwards and Returns
SSRN Electronic Journal, 2016Tax loss carry forward (TLCF), the accumulated corporate losses that can be applied to future or past taxable income, form an important asset in the corporate portfolio. In our sample (1964 - 2014) TCLF was on average equal to 17% of pretax income with considerable cross sectional variation. We show that a firm’s TLCF is a complex contingent claim that
Jack Favilukis +2 more
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Time Domain Reflectometer Return Loss Measurements
IEEE Transactions on Instrumentation and Measurement, 1969Equations are derived for the exact identification of a transmission line discontinuity that can be represented by an equivalent circuit consisting of one or more cascaded, series-inductive, parallel-capacitive, and series-transmission-line elements.
George D. Cormack, Ronald Paul Manning
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High-Definition Cabling and Return Loss
SMPTE Journal, 2001Return loss is signal attenuation caused by impedance variations in the structure of a cable or associated connection parts. These variations cause the signal to reflect (return) back to the source. At lower frequencies, return loss is a minor effect; at frequencies above 50 MHz, it can have a significant effect; and at frequencies used for high ...
Stephen H. Lampen +2 more
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Return loss in twisted pair cables
Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005., 2005Modeling of twisted pair cable (TPC) and simulating return loss (RL) is discussed and verified experimentally. A graphical user interface allows entering cable design data including materials, plating, stranding, twisting, and wire naming. A realistic 3D model of a twisted pair cable is calculated.
J. Poltz, M. Josefsson, J. Beckett
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Explaining Returns with Loss Aversion
SSRN Electronic Journal, 1998I develop and test an equilibrium asset pricing model based on loss averse investors. The model specifies a pricing kernel that is a nonmonotonic function of the market return. It also implies that investors demand a higher risk premium for risk associated with negative market returns than for positive market returns.
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Optical receiver design for high optical return loss
Applied Optics, 1992A new fiber pigtailed optical receiver design using a single gradient-index rod lens with a beveled exit face achieved a broadband optical return loss of > 65 dB, which was limited by the diffuse reflection from the photodetector front surface. By contrast the optical return loss for a receiver with an unbeveled lens exit face and an on-axis optical ...
D M, Braun, W V, Sorin
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Structural return loss phenomenon in coaxial cables
Proceedings of the IEEE, 1970This paper presents a study of the structural return loss (SRL) phenomenon pertaining to coaxial cables. Basic equations are developed, the effect of periodic changes in the physical structure of the cables is analyzed, measuring principles and techniques are discussed, and a method of fault location using the SRL test technique is given.
J.A. Olszewski, H. Lubars
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Return loss characteristics of optical fiber connectors
Journal of Lightwave Technology, 1996This paper describes the return loss characteristics for four typical contact type connectors: perpendicular and oblique endface connectors employing either physical contact or contact via index matching material. The high index layer on the polished fiber endface and the index matching material, which are important connector parameters, are ...
M. Kihara, S. Nagasawa, T. Tanifuji
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Simplified De-embedding for Return Loss Estimation
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 2021In some applications, it is shown that the peak return loss of a Device Under Test (DUT) can be accurately estimated from a knowledge of the magnitude of the s-parameters of the test fixture and the assembly. Numerical results illustrate advantages and limitations.
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