Results 1 to 10 of about 664 (133)

Optical properties of the jellyfish surface above the waterline: microvillar array in pleustonic hydrozoans [PDF]

open access: yesZoological Letters
Background The transparent jellyfish body is often difficult to see underwater, as its refractive index is similar to that of seawater, resulting in a low light reflectance on the body surface. Nevertheless, the outlines of jellyfish can be recognized by
Euichi Hirose   +4 more
doaj   +2 more sources

AI-based analysis algorithm incorporating nanoscale structural variations and measurement-angle misalignment in spectroscopic ellipsometry [PDF]

open access: yesNanophotonics
Spectroscopic ellipsometry (SE) is a powerful, non-destructive technique for nanoscale structural characterization. However, conventional SE data analysis typically assumes perfectly periodic specimen structures, overlooking fabrication-induced ...
Jung Juwon   +8 more
doaj   +2 more sources

Simulation of Rough Surface of CIGS (CuInGaSe) Solar Cell by RCWA (Rigorous Coupled Wave Analysis) Considering the Incoherency of Light [PDF]

open access: yesJournal of the Optical Society of Korea, 2014
The surface of semiconductor solar cells, such as a-Si or CIGS (CuInGaSe) solar cells is not flat but textured in the microscopic domain. With textured surfaces, the optical reflectivity of a solar cell is different from that of flat surfaces in the wavelength region.
openaire   +3 more sources

Efficient Rigorous Coupled-Wave Analysis Without Solving Eigenvalues for Analyzing One-Dimensional Ultrathin Periodic Structures

open access: yesIEEE Access, 2020
Based on the first-order Taylor expansion, an efficient Rigorous Coupled-Wave Analysis (RCWA) for one-dimensional ultrathin periodic structures is proposed in this paper.
Jie Li   +8 more
doaj   +3 more sources

Symmetry Breaking as a Basis for Characterization of Dielectric Materials [PDF]

open access: yesSensors
This paper introduces a novel method for measuring the dielectric permittivity of materials within the microwave and millimeter wave frequency ranges. The proposed approach, classified as a guided wave transmission system, employs a periodic transmission
Dubravko Tomić, Zvonimir Šipuš
doaj   +2 more sources

Time‐Efficient, Accurate, and Experimentally Grounded Optical Modeling of Multiscale‐Textured Thin‐Film Solar Cells [PDF]

open access: yesGlobal Challenges
Accurate prediction of optical performance in solar cells with multiscale‐textured interfaces is essential for optimizing light management in next‐generation photovoltaics.
Federica Saitta   +5 more
doaj   +2 more sources

Manufacturing Anti-Reflective Subwavelength Structures on ZnS Using Femtosecond Laser Bessel Beam with Burst Mode [PDF]

open access: yesBiomimetics
Increasing the transmittance of zinc sulfide (ZnS) infrared windows can effectively improve the imaging quality of infrared detection. In this study, an anti-reflective subwavelength structure (ASS) was manufactured on ZnS using a femtosecond burst ...
Haoran Wang   +3 more
doaj   +2 more sources

Stack of cellular lamellae forms a silvered cortex to conceal the opaque organ in a transparent gastropod in epipelagic habitat [PDF]

open access: yesPeerJ, 2022
Background Gelatinous zooplankton in epipelagic environments often have highly transparent bodies to avoid detection by their visual predators and prey; however, the digestive systems are often exceptionally opaque even in these organisms.
Daisuke Sakai   +3 more
doaj   +2 more sources

Enhancement of Photodetector Responsivity in Standard SOI CMOS Processes by introducing Resonant Grating Structures [PDF]

open access: yesJournal of the European Optical Society-Rapid Publications, 2011
A new photodetector concept is described, which is fully compatible with the standard SOI CMOS process and does not require any post-processing steps. Our simulations are based on two-dimensional RCWA (Rigorous Coupled Wave Analysis) and local absorption
Auer M., Brenner K.-H.
doaj   +1 more source

Efficient Rigorous Coupled-Wave Analysis Simulation of Mueller Matrix Ellipsometry of Three-Dimensional Multilayer Nanostructures

open access: yesNanomaterials, 2022
Mueller matrix ellipsometry (MME) is a powerful metrology tool for nanomanufacturing. The application of MME necessitates electromagnetic computations for inverse problems of metrology determination in both the conventional optimization process and the ...
Hoang-Lam Pham   +4 more
doaj   +1 more source

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