Nanomaterials, 2022 Mueller matrix ellipsometry (MME) is a powerful metrology tool for nanomanufacturing. The application of MME necessitates electromagnetic computations for inverse problems of metrology determination in both the conventional optimization process and the ...
Hoang-Lam Pham +4 more
doaj +2 more sources
Enhancement of Photodetector Responsivity in Standard SOI CMOS Processes by introducing Resonant Grating Structures [PDF]
Journal of the European Optical Society-Rapid Publications, 2011 A new photodetector concept is described, which is fully compatible with the standard SOI CMOS process and does not require any post-processing steps. Our simulations are based on two-dimensional RCWA (Rigorous Coupled Wave Analysis) and local absorption
Auer M., Brenner K.-H.
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Optical properties of the jellyfish surface above the waterline: microvillar array in pleustonic hydrozoans [PDF]
Zoological LettersBackground The transparent jellyfish body is often difficult to see underwater, as its refractive index is similar to that of seawater, resulting in a low light reflectance on the body surface. Nevertheless, the outlines of jellyfish can be recognized by
Euichi Hirose +4 more
doaj +2 more sources
AI-based analysis algorithm incorporating nanoscale structural variations and measurement-angle misalignment in spectroscopic ellipsometry [PDF]
NanophotonicsSpectroscopic ellipsometry (SE) is a powerful, non-destructive technique for nanoscale structural characterization. However, conventional SE data analysis typically assumes perfectly periodic specimen structures, overlooking fabrication-induced ...
Jung Juwon +8 more
doaj +2 more sources
Numerical Estimation of Bending in Holographic Volume Gratings by Means of RCWA and Deep Learning [PDF]
Applied SciencesIn this paper, we introduce a novel approach to model bending phenomena on holographic volume gratings based on Rigorous Coupled Wave Analysis (RCWA), in which the bending as a phase in the dielectric permittivity expansion is introduced, and the ...
Jaume Colomina-Martínez +6 more
doaj +2 more sources
Symmetry Breaking as a Basis for Characterization of Dielectric Materials [PDF]
SensorsThis paper introduces a novel method for measuring the dielectric permittivity of materials within the microwave and millimeter wave frequency ranges. The proposed approach, classified as a guided wave transmission system, employs a periodic transmission
Dubravko Tomić, Zvonimir Šipuš
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Beilstein Journal of Nanotechnology, 2018 A variety of light management structures have been introduced in solar cells to improve light harvesting and further boost their conversion efficiency. Reliable and accurate simulation tools are required to design and optimize the individual structures ...
Ziga Lokar +3 more
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Time‐Efficient, Accurate, and Experimentally Grounded Optical Modeling of Multiscale‐Textured Thin‐Film Solar Cells [PDF]
Global ChallengesAccurate prediction of optical performance in solar cells with multiscale‐textured interfaces is essential for optimizing light management in next‐generation photovoltaics.
Federica Saitta +5 more
doaj +2 more sources
AIP Advances, 2017 Light trapping within a light absorbing medium is a key to highly efficient thin film solar cells. We propose a large-scale procedure based on materials with low absorption for the fabrication of combined Distributed Bragg Reflector (DBR) and grating ...
B. Brudieu +5 more
doaj +2 more sources
Freestanding Polymer Metasurface Supporting Higher‐Order Optical Resonances for Strong Field Enhancement in TMD Monolayers [PDF]
Small, Volume 22, Issue 35, 23 June 2026.A freestanding polymer metasurface is developed to enhance light emission from atomically thin semiconductors. By supporting higher‐order optical resonances that concentrate electromagnetic fields at the surface, the platform significantly improves coupling between light and WS2 monolayer.
Chih‐Zong Deng +10 more
wiley +2 more sources