Results 241 to 250 of about 2,450,363 (303)

Time‐Resolved Simultaneous Mapping of Thickness and Nanoparticle Concentration in Nanofluid Thin Films via Imaging Ellipsometry and Deep‐UV Reflectance Imaging

open access: yesAdvanced Materials Interfaces, EarlyView.
This study establishes a dual‐channel optical metrology framework integrating phase‐shifting imaging ellipsometry and deep‐UV reflectance imaging. This label‐free approach enables simultaneous, time‐resolved mapping of film thickness and nanoparticle (NP) concentration in dynamic nanofluid thin films.
Eita Shoji   +3 more
wiley   +1 more source

A Survey of Interlayer Interaction Models for Graphene and Other 2D Materials

open access: yesAdvanced Materials Interfaces, EarlyView.
Van der Waals interactions arising from electronic polarization at atomically close interfaces generate corrugated interlayer energy landscapes that govern normal and tangential tractions. This review presents an overview of quantum, atomistic, analytical, and continuum modeling approaches, highlighting their roles across length scales in capturing ...
Gourav Yadav   +2 more
wiley   +1 more source

State capacity and health system financing: a cross-country analysis. [PDF]

open access: yesBMJ Glob Health
Mazumdar S   +5 more
europepmc   +1 more source

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