Results 251 to 260 of about 1,171,960 (265)
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Run Length Distributions of Residual Control Charts for Autocorrelated Processes

Journal of Quality Technology, 1994
Herbert Moskowitz
exaly  

Optimal design of the adaptive EWMA chart for the mean based on median run length and expected median run length

Quality Technology and Quantitative Management, 2019
Anan Tang   +2 more
exaly  

When Do Long-Run Identifying Restrictions Give Reliable Results?

Journal of Business and Economic Statistics, 1997
Jon Faust, Eric M Leeper
exaly  

Minimum entropy based run-to-run control for semiconductor processes with uncertain metrology delay

Journal of Process Control, 2009
Jianhua Zhang   +2 more
exaly  

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