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Monitoring the Coefficient of Variation Using Control Charts with Run Rules

Quality Technology and Quantitative Management, 2013
Philippe Castagliola   +2 more
exaly  

Mixed product run-to-run process control – An ANOVA model with ARIMA disturbance approach

Journal of Process Control, 2009
Shi-Shang Jang, David S H Wong
exaly  

Minimum entropy based run-to-run control for semiconductor processes with uncertain metrology delay

Journal of Process Control, 2009
Jianhua Zhang, Jose Munoz, Junghui Chen
exaly  

Running up the `down' escalator

Management in Education, 2004
openaire   +1 more source

ANGOLA: Electoral Run‐Up

Africa Research Bulletin: Political, Social and Cultural Series, 2012
openaire   +1 more source

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