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Progress in RF-MEMS. [PDF]

open access: yesMicromachines (Basel)
Tait RN.
europepmc   +1 more source
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Schottky barriers of scandium and scandium monosilicide on silicon

Applied Surface Science, 1991
Abstract The Schottky barrier heights of scandium deposited on n- and p-type silicon have been measured by the capacitance versus voltage technique. Respective values of about 0.4 and 0.7 eV were determined; they do not change upon the formation of the monosilicide, ScSi, after annealing at 500°C.
F.M. d'Heurle   +3 more
openaire   +1 more source

Scandium, yttrium and the lanthanides

ChemInform, 2003
AbstractFor Abstract see ChemInform Abstract in Full Text.
John G. Brennan, Andrea Sella
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Scandium

Fresenius' Zeitschrift für analytische Chemie, 1963
M. Bartušek, Liselott Johannsen
  +5 more sources

Scandium titanite and scandium vanadite

Inorganic Chemistry, 1967
Allen Forrest Reid, Michell J. Sienko
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Scandium

Fresenius' Zeitschrift f�r Analytische Chemie, 1960
  +4 more sources

Scandium

Fresenius' Zeitschrift für analytische Chemie, 1966
openaire   +2 more sources

Scandium

Fresenius' Zeitschrift für analytische Chemie, 1962
L. Sommer, L. J. Ottendorfer
openaire   +1 more source

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