Results 271 to 280 of about 15,077 (301)
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A 1.1 GHz Scanned Acoustic Microscope
1972A 1.1 GHz acoustic microscope is being developed with an anticipated resolution capability of 5 μm. The microscope uses a unique scanning method which employs the photoconductive effect to locally switch a CdS piezoelectric transducer. A focused laser beam scanned across the CdS transducer sequentially deactivates resolution elements and generates the ...
B. A. Auld +4 more
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High resolution scanning acoustical microscope
SPIE Proceedings, 2005Some results obtained with developed high resolution scanning acoustical microscope are shown in present paper. Designed and developed system is capable for capturing both bulk acoustical images, as well as the plane images obtained as cuts in desirable section of an object; so, so-called B-scan as well as C-scan are realized. Created systems provided
Vladimir Petrov +4 more
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Near-field scanning acoustic microscope
Proceedings., IEEE Ultrasonics Symposium, 2003A traditional scanning acoustic microscope (SAM) has been modified to operate in the near-field mode. A pinhole in a thin shim of brass defines the resolution of the instrument, which can be as small as 0.1 lambda . In an edge scan experiment, a 125- mu m-thick brass shim with a pinhole size of 125 mu m, a SAM operating at 3 MHz, and a transducer with ...
B.T. Khuri-Yakub +3 more
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Silicon acoustic lens for scanning acoustic microscope (SAM)
TRANSDUCERS '91: 1991 International Conference on Solid-State Sensors and Actuators. Digest of Technical Papers, 2002A single crystal silicon lens for a scanning acoustic microscope (SAM) has been developed by using lithography and chemical etching. Excellent sphericity and the minimal surface roughness demanded for a lens profile have been obtained through suitable etching.
H. Hashimoto, S. Tanaka, K. Sato
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Automation and system integration of Scanning Tomographic Acoustic Microscope
Computerized Medical Imaging and Graphics, 1997The Scanning Tomographic Acoustic Microscope (STAM) is an instrument capable of performing subsurface imaging of microscopic specimens. Designed around the Scanning Laser Acoustic Microscope (SLAM), the STAM incorporates numerous hardware and software advances which allow automated imaging of the acoustic properties of thick specimens at high ...
S D, Kent, H, Lee
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Acoustic Velocity Using the Scanning Laser Acoustic Microscope (SLAM)
1982 Ultrasonics Symposium, 1982A technique has been developed for determining the acoustic v elocity in solids using Sonoscan's SLAM which does not r equire the interferogram image to show continuous interference lines at the reference medium-solid boundary. This has the advantage of eliminating the rather elaborate machining of a "step" into the solid to offset the e ffects of ...
M.A. McAvoy, W.D. O'Brien
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Properties of Films Characterized by Scanning Acoustic Microscope
Advanced Materials Research, 2014The scanning acoustic microscope is used to detect the properties of films. The ultrasonic wave propagates in the films with thickness h, acoustic impedance Z2 between medium with acoustic impedance Z1. The echoes from upper and lower interfaces overlap and interfere. The echoes are transformed by FFT.
Hong Juan Yan +3 more
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The Acoustic Parameters Measurement by the Doppler Scanning Acoustic Microscope
2006Doppler continuous wave scanning acoustic microscope was developed for the investigation of the reflectance function at a frequency of 300 MHz. By testing aluminum, steel and fused quartz samples it was shown that the errors of the acoustic parameters estimation are: 9% for density, 7%, 2.5%, 1.4%- for longitudinal, shear and leaky Rayleigh waves ...
R. G. Maev, S. A. Titov
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Doppler continuous wave scanning acoustic microscope
1997 IEEE Ultrasonics Symposium Proceedings. An International Symposium (Cat. No.97CH36118), 2002A modification of V(z) method is presented in this paper. It is proposed to use the Doppler effect in the continuous wave reflection scanning acoustic microscope. The Doppler frequency shift is created due to constant velocity movement of the lens perpendicular to the sample surface.
S.A. Titov, V.G. Maev
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A Scanning Acoustic Microscope
1973 Ultrasonics Symposium, 1973R.A. Lemons, C.F. Quate
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