Results 1 to 10 of about 762,917 (332)

Low-cost electron detector for scanning electron microscope [PDF]

open access: yesHardwareX, 2023
Electron microscopy is an indispensable tool for the characterization of (nano) materials. Electron microscopes are typically very expensive and their internal operation is often shielded from the user.
Evgenii Vlasov   +2 more
doaj   +2 more sources

Scanning electron microscope-based evaluation of eggshell quality [PDF]

open access: yesPoultry Science
: The eggshell is the outermost covering of an egg that provides physical and chemical protection. It is a major source of calcium and minerals for the growing embryo during incubation.
Prem Lal Mahato   +4 more
doaj   +2 more sources

Sub-ångström resolution ptychography in a scanning electron microscope at 20 keV [PDF]

open access: yesNature Communications
Achieving sub-ångström (30 keV) beam and a transmission electron microscope (TEM) fitted with an aberration corrector and a high efficiency, high pixel-count camera.
Arthur M. Blackburn   +3 more
doaj   +2 more sources

Tick (Acari: Ixodidae) infestation of cuscuses from Maluku Province, Indonesia [PDF]

open access: yesVeterinary World, 2021
Background and Aim: Cuscuses are one of the endemic Indonesian marsupials, which needs to be protected and revived in terms of the numbers and range of species. Ectoparasites of ticks (Ixodidae) are one potential obstacle to cuscus conservation.
Prasetyarti Utami   +2 more
doaj   +1 more source

Isolation and Partial Characterization of Glycolipopeptide Biosurfactant Derived from A Novel Lactiplantibacillus plantarum Lbp_WAM

open access: yesMaǧallaẗ al-baṣraẗ al-ʻulūm al-zirāʻiyyaẗ, 2022
Biosurfactants are amphipathic molecules generated by a variety of microorganisms with different biological functions. In this study, lactic acid bacteria were screened for their emulsification properties.
Alaa A. Al-Seraih   +4 more
doaj   +1 more source

Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization

open access: yesApplied Sciences, 2021
The main objectives of this work are the development of fundamental extensions to existing scanning microwave microscopy (SMM) technology to achieve quantitative complex impedance measurements at the nanoscale.
Petr Polovodov   +7 more
doaj   +1 more source

Direct imaging of electron density with a scanning transmission electron microscope

open access: yesNature Communications, 2023
Recent studies of secondary electron (SE) emission in scanning transmission electron microscopes suggest that material’s properties such as electrical conductivity, connectivity, and work function can be probed with atomic scale resolution using a ...
Ondrej Dyck   +8 more
doaj   +1 more source

A method of magnetic field measurement in a scanning electron microscope using a microcantilever magnetometer

open access: yesMetrology and Measurement Systems, 2020
Scanning electron microscopy (SEM) is a perfect technique for micro-/nano-object imaging [1] and movement measurement [2, 3] both in high and environmental vacuum conditions and at various temperatures ranging from elevated to low temperatures.
Orłowska Karolina   +10 more
doaj   +1 more source

MICROSTRUCTURE RESEARCH OF FLOAT-TYPE GYRO ROTORS BY SCANNING ELECTRON MICROSCOPE [PDF]

open access: yesНаучно-технический вестник информационных технологий, механики и оптики, 2019
Subject of Research. The methods are proposed for input control of the float-type gyro rotors, which are part of more than two hundred inertial navigation systems currently being in operation.
A. V. Startseva   +2 more
doaj   +1 more source

Closed-Loop Autofocus Scheme for Scanning Electron Microscope

open access: yesMATEC Web of Conferences, 2015
In this paper, we present a full scale autofocus approach for scanning electron microscope (SEM). The optimal focus (in-focus) position of the microscope is achieved by maximizing the image sharpness using a vision-based closed-loop control scheme.
Cui Le   +4 more
doaj   +1 more source

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