Results 291 to 300 of about 1,075,988 (340)

Collection of secondary electrons in scanning electron microscopes

Journal of Microscopy, 2009
SummaryCollection of the secondary electrons in the scanning electron microscope was simulated and the results have been experimentally verified for two types of the objective lens and three detection systems. The aberration coefficients of both objective lenses as well as maximum axial magnetic fields in the specimen region are presented. Compared are
Ilona Müllerová, Ivo Konvalina
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A New Scanning Electron Microscope

1969
The design of the scanning electron microscope described here is based on the same modular concept as the Materials Analysis Company X-ray microprobe analyzers; and in fact, some parts are common to both instruments. The modularity of the instrument assures outstanding ease of disassembly and assembly for routine maintenance and cleaning, and allows ...
V. G. Macres, N. C. Yew, O. Preston, R. Buchanan   +3 more
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Scanning electron microscope

Characterization of Polymers and Fibres, 2022
M. Singh, Annika Singh
semanticscholar   +1 more source

Virtual scanning electron microscope

SPIE Proceedings, 2013
Application of virtual instruments to a process of measurements of geometrical characteristics of investigated objects is considered. Methods of construction of virtual instruments on a base of imitators and simulators are discussed. It is demonstrated, that a virtual scanning electron microscope (SEM) can be constructed only on the base of simulator ...
Yu. A. Novikov, Yu. V. Larionov
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Photogrammetry with the scanning electron microscope [PDF]

Journal of Physics E: Scientific Instruments, 1973
A photogrammetric technique is described, which allows simple and accurate measurements of surface microgeometry with a scanning electron microscope. Simple working formulae are obtained with a proper choice of the reference axes. The error evaluation is performed for an elementary case.
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PHOTOGRAMMETRY AND THE SCANNING ELECTRON MICROSCOPE

The Photogrammetric Record, 1975
AbstractThe scanning electron microscope forms images of the surfaces of objects located in a vacuum specimen chamber. A fine beam of electrons scans the surface in synchronism with a cathode ray tube whose spot brightness is modulated by the secondary electron signal emanating from the specimen.
H. F. Ross, Alan Boyde
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Mesiodens in Scanning Electron Microscope

Microscopy and Microanalysis, 2007
Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7 ...
B Kawka, B J J drych, K Czerny, W Matysiak, M Rumi ski Rumi ski   +4 more
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Electron Optics of a Scanning Electron Microscope

1985
Electrons emitted from thermionic, Schottky or field-emission cathodes are accelerated by a voltage of 0.1–50 keV between cathode and anode. The purpose of the electron optics of a SEM is to produce a small electron probe at the specimen by demagnifying the smallest virtual cross-section of the electron beam near the cathode.
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Electron spectroscopy in the scanning electron microscope

Ultramicroscopy, 1985
Abstract The combination of ultra high vacuum scanning electron microscopy with spectroscopy of the emitted electrons gives new possibilities for surface analysis. The paper surveys recent results in secondary, Auger, ionization loss, and elastic peak electron spectroscopy.
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A combined scanning tunneling microscope and scanning electron microscope

1996
A scanning tunneling microscope (STM) was developed to work in conjunction with a Hitachi S-4100 field emission scanning electron microscope (SEM). To achieve the necessary five degrees of freedom for sample and probe movement, an entirely mechanical method was used, employing pairs of parallelogram flexure hinges actuated by set screws driven through ...
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