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Automated four-point probe measurement of nanowires inside a scanning electron microscope

IEEE International Conference on Automation Science and Engineering, 2010
Changhai Ru   +6 more
semanticscholar   +1 more source

Metrology in Scanning Electron Microscope

Microscopy and Microanalysis, 2007
Michael A. Sutton, Na Li
openaire   +2 more sources

Scanning electron microscope observation of dislocations in semiconductor and metal materials.

Journal of Electron Microscopy, 2010
N. Kuwano   +3 more
semanticscholar   +1 more source

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