Results 81 to 90 of about 2,657,162 (276)
Scanning confocal electron microscope [PDF]
A scanning confocal microscope and methods are provided for configuring scanning confocal microscopes for imaging specimens, such as, high resolution imaging of thick non-optically transparent specimens including imaging of buried or subsurface features ...
core +2 more sources
Dentinal Tubule Occluding Efficacy of Three Nano Biomaterials Containing Toothpastes on Simulated Hypersensitive Dentin: An SEM and EDX In-vitro Analysis [PDF]
Introduction: Dentin Hypersensitivity (DH) is a common dental issue characterised by sharp pain in response to stimuli. Desensitising toothpastes provide lasting relief by sealing dentinal tubules.
Neha Mundhada +4 more
doaj +1 more source
Multilayer Self‐Limiting Electrospray Deposition via Stepped Voltage Bias
Self‐limiting electrospray deposition (SLED) uses a high voltage to generate and deposit a charged payload on a target surface. The coating retains its charge, repelling newly arriving material. SLED thickness can be decreased by applying a secondary bias to the target.
Madhuri Deb +3 more
wiley +1 more source
Controlling the Field Assisted Sintering Technology (FAST) parameters, dwell temperature and cooling rate, significantly influences the microstructural evolution in titanium aluminide GE4822. Significant γ‐lamellar colonies develop only upon cooling through the α‐transus.
Jack Krohn, James Pepper, Martin Jackson
wiley +1 more source
Fast scanning electron microscope (FSEM)
High magnification and large depth of field with a temporal resolution of less than 100 microseconds are possible using the present invention which combines a linear electron beam produced by a tungsten filament from an SX-40A Scanning Electron ...
Wang, Ming L. +2 more
core
Postbuild annealing systematically modifies the phase fractions and morphology of EB‐PBF processed Mo–9Si–8B. Quantitative microstructure–property correlations reveal how controlled phase evolution enhances high‐temperature compressive strength and creep resistance.
Christopher Schmidt +5 more
wiley +1 more source
Open-world scanning electron microscope nano-defect category discovery via self-normal prototypes
Nanoscale defect classification is crucial for yield enhancement in integrated circuit (IC) manufacturing. However, existing methods rely heavily on static external datasets.
Botong Zhao +4 more
doaj +1 more source
Deep‐UV (258 nm) femtosecond pulses enable uniform amorphous silicon writing on Si(100)/(111) with a six‐fold larger fluence amorphization window than NIR methods. Optimized fluence and overlap yield 20–45 nm uniform and continuous amorphous layers. Microscopy shows sharp interfaces, and real‐time reflectivity reveals nanosecond melt–resolidification ...
Wissal Benali +5 more
wiley +1 more source
Morphological and Molecular Diagnosis of microfilaria species in blood of naturally infected sheep in Mosul city, Iraq [PDF]
The present study aimed to use morphometric and genetic characteristics to identify the species of filarioid worms that infest sheep in Mosul city, Iraq.
Haneen Alabadi, Sura Aghwan
doaj +1 more source
This article investigates the dependence of the properties on the manufacturing orientation in the form of the inclination angle to the build plate of LPBF‐fabricated NiTi rods with a diameter of 150–220 µm. Metallographic, chemical, thermal, and mechanical characterization show behavior under identical manufacturing conditions that ranges from ...
Sandra Herzig +2 more
wiley +1 more source

