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Edge Detection in Scanning Electron Microscope (SEM) Images using Various Algorithms
2020 4th International Conference on Intelligent Computing and Control Systems (ICICCS), 2020In Image Processing Edge detection is very important. It is an essential technique to improve image quality in various fields including medical, space, biological materials etc. Images are generally represented by its intensities either in grey scale or in color scale.
G Elizabeth Rani +2 more
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DURIP 00 Scanning Electron Microscope (SEM)
2001Abstract : Upon completion of the installation, work proceeded in making the new Scanning Electron Microscope available for remote operation via the Internet. This has been accomplished and demonstrations were given to local High School Science teachers.
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Remote Operation of a Scanning Electron Microscope (SEM) from Distant Classrooms
Proceedings, annual meeting, Electron Microscopy Society of America, 1996California State University, Hayward (CSUH) has successfully demonstrated remote operation of a scanning electron microscope (SEM) using several networking interfaces. One of these methods is the use of highbandwidth asynchronous transfer mode (ATM). The different networking schemes have made it possible for instructors and researchers to access and ...
N. R. Smith +3 more
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XY table and tilting stage for scanning electron microscope (SEM)
Review of Scientific Instruments, 1975This paper describes a low−vibration specimen stage in which the specimen is held by a block which slides on Teflon pads over the lower surface of the SEM lens. It provides X, Y, and tilting motions.
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International Symposium for Testing and Failure Analysis, 2002
Abstract This paper describes the problems encountered and solutions found to the practical objective of developing an imaging technique that would produce a more detailed analysis of IC material structures then a scanning electron microscope.
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Abstract This paper describes the problems encountered and solutions found to the practical objective of developing an imaging technique that would produce a more detailed analysis of IC material structures then a scanning electron microscope.
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Submicron 3-Dimensional Structure Observation by Cyclotron SEM(Scanning Electron Microscope)
Japanese Journal of Applied Physics, 1991Experimental and numerical approaches have been taken to the study of the brightness of scanning electron microscope(SEM) images for bottom surfaces of deep holes and trenches by Cyclotron SEM. Secondary electrons emitted from the bottom are efficiently collected as an image signal by a couple of the following combinational effects.
Noboru Nomura +2 more
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Comparative scanning electron microscope (SEM) study of miracidia of four human schistosome species
International Journal for Parasitology, 1985Abstract The miracidia of four human blood flukes, Schistosoma haematobium , S. intercalatum , S. mansoni and S. japonicum , have been studied by means of the scanning electron microscope (SEM). Differences have been observed in their respective dimensions, in the configuration of their terebratoria (apical papillae), in the shape of the ...
D T, Eklu-Natey +4 more
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American Journal of Orthodontics and Dentofacial Orthopedics, 1993
The objective of this work was to perform failure analysis on Starfire brackets that failed in clinical use. The failed brackets were examined with a scanning electron microscope (SEM) to obtain micrographs at magnifications of 20, 50, 100, and other magnifications, whenever necessary.
A D, Viazis, K A, Chabot, C S, Kucheria
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The objective of this work was to perform failure analysis on Starfire brackets that failed in clinical use. The failed brackets were examined with a scanning electron microscope (SEM) to obtain micrographs at magnifications of 20, 50, 100, and other magnifications, whenever necessary.
A D, Viazis, K A, Chabot, C S, Kucheria
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The observation of crystalline materials in the scanning electron microscope (SEM)
Journal of Microscopy, 1975SUMMARYContrast effects from electron channelling in crystalline solids can be observed in the scanning electron microscope by the correct choice of operating conditions. The crystallographic symmetry and orientation of specimen areas as small as 1 μm in diameter can be determined, and detailed quantitative information obtained about the density ...
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