Results 81 to 90 of about 509,762 (201)
Dynamic-scanning-electron-microscope study of friction and wear [PDF]
A friction and wear apparatus was built into a real time scanning electron microscope (SEM). The apparatus and SEM comprise a system which provides the capability of performing dynamic friction and wear experiments in situ.
Brainard, W. A., Buckley, D. H.
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A critical study of the role of the surface oxide layer in titanium bonding [PDF]
Scanning electron microscope/X-ray photoelectron spectroscopy (SEM/XPS) analysis of fractured adhesively bonded Ti 6-4 samples is discussed. The text adhesives incuded NR 056X polyimide, polypheylquinoxaline (PPQ), and LARC-13 polyimide.
Dias, S., Wightman, J. P.
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Possibilities on Latest Generation Scanning Electron Microscopes (SEM)
During the last 10 years development of SEM with cold field emission guns working with low acceleration voltage lead to a substantial increase in resolving power. In addition the suppliers started to combine such SEM columns with focused ion beam columns (FIB).
Pulfer, Kurt +4 more
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Ion Recrystallization and Spheroidization in Amorphous AlN-TiB2-TiSi2 as a Result of Annealing and Subsequent Implantation by Negative ion Au – [PDF]
This paper presents new results on investigation of the influence of Au- negative ion beam implantation and thermal annealing under 900 °C and 1300 °C on structure and characteristics of AlN-TiB2-TiSi2 coatings prepared by magnetron sputtering.
Bondar, O.V. +6 more
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Examination of exfoliated cervical cells by the scanning electron microscope (SEM) [PDF]
J M Allen +3 more
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Background Glass fiber-reinforced polymer (GFRP) bars offer a superior alternative to steel bars in concrete reinforcement but are associated with wider cracks and higher deformation rates. This study introduces a novel approach by combining steel fibers
Amany Salman, Ahmed Hassan, H. I. Ahmed
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Scanning-electron-microscope used in real-time study of friction and wear [PDF]
Small friction and wear apparatus built directly into scanning-electron-microscope provides both dynamic observation and microscopic view of wear process.
Brainard, W. A., Buckley, D. H.
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Signal-to-Noise Ratio in Scanning Electron Microscopy: A Comprehensive Review
Scanning Electron Microscopy (SEM) is critical in nanotechnology, materials science, and biological imaging due to its high spatial resolution and depth of focus.
Kok Swee Sim +3 more
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Observation of microcultured-nitzschia palea in scanning electron microscope (SEM)
In this research. Nitzschia palea from Bacillariophyta division (in samples which received from surroundings Tokat-Turkey) have been cultured in culture medium and inve.stigatcd in scanning elec tron microscope (SEM), In analysis of micrograph have been observed that polar ncxlule has different morphological structure.
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