Results 151 to 160 of about 2,192,460 (375)
High‐performance nickel‐based superalloys are often not processible in additive manufacturing (AM) due to hot cracking. The findings in this manuscript propose an efficient method to mitigate cracking and enhance mechanical properties of these alloys by producing a metal matrix composite, contributing to the material and process perspective of the AM ...
Klaus Büßenschütt+3 more
wiley +1 more source
Cryo Field Emission Scanning Electron Microscopy
Stanley L. Erlandsen+3 more
doaj +1 more source
Scanning Electron Microscopy of the Skin Using Celluloid Impressions
Tsuneo Fujita+2 more
openalex +2 more sources
This study explores the effects of pixel size and spacing when fabricating electroluminescent (EL) multipixel displays. COMSOL simulations identify the impact of pixel dimensions and spacing on electric field distribution and lighting efficiency. Flexible, high‐resolution EL pixel arrays are reverse offset printed, achieving a 96% reduction in pixel ...
Huanghao Dai+3 more
wiley +1 more source
Scanning Electron Microscopy of Ascospores of Schwanniomyces [PDF]
Cletus P. Kurtzman+2 more
openalex +1 more source
The fused filament‐fabricated MAR‐M247 alloy without hot isostatic pressing shows the lowest porosity of 4%. Heat treatment at 1220 °C produces coarse precipitates and carbides. Specimens heat‐treated at 1220 °C exhibit higher tensile strength (683 MPa) and elongation (10%) at room temperature.
Haneen Daoud+7 more
wiley +1 more source
A high-yield technique for preparing cells fixed in suspension for scanning electron microscopy. [PDF]
S K Sanders+2 more
openalex +1 more source
This work reveals the phase composition and quantitative morphology analysis of precipitation‐hardened Fe32Cu12Ni11Ti16Al29 complex‐concentrated alloy. The precipitates are shown to have a high coherency. Morphology transition between sphere, cuboidal, and elongated morphology is observed. Finally, the overaging behavior is captured using microhardness.
Rostyslav Nizinkovskyi+4 more
wiley +1 more source
Scanning Electron Microscopy as an Aid to Pollen Taxonomy
John E. Ridgway, John J. Skyvarla
openalex +2 more sources