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Reduced polyethylene wear in dual mobility versus single mobility hip implants: Results from quantitative and qualitative scanning electron microscopy analysis. [PDF]
J Exp OrthopGigante AP +4 more
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Sample preparation and data collection for serial block face scanning electron microscopy of mammalian cell monolayers. [PDF]
PLoS OneAntao NV +5 more
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Histopathology, 1982
The technology of scanning electron microscopy (SEM) is described in brief. Its application to the study of cell and tissue structure is demonstrated and the evolution of the concept of ‘topographical histology’ is discussed. Some current literature on the applications of SEM is reviewed under the headings of experimental pathology and human pathology.
P. G. Toner, K. E. Carr, K. M. Saleh
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The technology of scanning electron microscopy (SEM) is described in brief. Its application to the study of cell and tissue structure is demonstrated and the evolution of the concept of ‘topographical histology’ is discussed. Some current literature on the applications of SEM is reviewed under the headings of experimental pathology and human pathology.
P. G. Toner, K. E. Carr, K. M. Saleh
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Scanning Electron Microscopy [PDF]
, 1994 Since the appearance of the first commercial scanning electron microscope (SEM) three decades ago, major advances were achieved in resolution, new electron probe sources, the development of additional modes, and computerization (including built-in image store capabilities in the current generation of instruments).
D. B. Holt, B. G. Yacobi
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2019
This chapter provides an overview of the concepts of scanning electron microscopy () from a theoretical as well as practical operational perspective. The theory section begins with the basics of image formation followed by an explanation of the interaction of the electron beam with the sample.
Rudolf Reichelt +2 more
+9 more sources
This chapter provides an overview of the concepts of scanning electron microscopy () from a theoretical as well as practical operational perspective. The theory section begins with the basics of image formation followed by an explanation of the interaction of the electron beam with the sample.
Rudolf Reichelt +2 more
+9 more sources
Optica Acta: International Journal of Optics, 1986
Abstract Scanning electron microscopy (SEM) has shown various significant improvements since it first became available in 1965. These improvements include enhanced resolution, dependability, ease of operation, and reduction in size and cost.
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Abstract Scanning electron microscopy (SEM) has shown various significant improvements since it first became available in 1965. These improvements include enhanced resolution, dependability, ease of operation, and reduction in size and cost.
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Journal of The Electrochemical Society, 1977
A detailed examination of materials is vital to any investigation relating to the processing properties and behavior of materials. Characterization includes all information relating to topographical features, morphology, habit and distribution, identification of differences based on chemistry, crystal structure, physical properties, and subsurface ...
E. K. Brandis, O. Johari
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A detailed examination of materials is vital to any investigation relating to the processing properties and behavior of materials. Characterization includes all information relating to topographical features, morphology, habit and distribution, identification of differences based on chemistry, crystal structure, physical properties, and subsurface ...
E. K. Brandis, O. Johari
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Scanning Electron Microscopy [PDF]
, 2003 Scanning electron microscopy (SEM) has a history almost as old as TEM, but the development of a commercial product took much longer. (1938) built the first SEM, and (1942) produced an SEM with a 50-nm probe. A group in Cambridge, England headed by Oatley began work in 1948 that led to the first commercial SEM (the Cambridge Stereoscan) in 1965.
Laura E. Reuss, Michael J. Dykstra
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1975
The scanning electron microscope (sem) is an instrument designed primarily for studying the surfaces of solids at high magnification. In this respect it may be compared with the optical microscope, and a set of micrographs taken on each instrument is shown in figure 2.1.
D. K. Bowen, C. R. Hall
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The scanning electron microscope (sem) is an instrument designed primarily for studying the surfaces of solids at high magnification. In this respect it may be compared with the optical microscope, and a set of micrographs taken on each instrument is shown in figure 2.1.
D. K. Bowen, C. R. Hall
openaire +2 more sources