Results 1 to 10 of about 840,881 (357)
Membrane-Based Scanning Force Microscopy [PDF]
Physical Review Applied, 2020 We report the development of a scanning force microscope based on an ultra-sensitive silicon nitride membrane transducer. Our development is made possible by inverting the standard microscope geometry - in our instrument, the substrate is vibrating and ...
David Hälg +13 more
semanticscholar +7 more sources
A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2022 Cantilever-based atomic force microscopy (AFM) performed under ambient conditions has become an important tool to characterize new material systems as well as devices.
Hao Liu +5 more
doaj +2 more sources
Scanning Drop Friction Force Microscopy
Langmuir, 2022 Wetting imperfections are omnipresent on surfaces. They cause contact angle hysteresis and determine the wetting dynamics. Still, existing techniques (e.g., contact angle goniometry) are not sufficient to localize inhomogeneities and image wetting ...
Chirag Hinduja +6 more
semanticscholar +4 more sources
High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy [PDF]
Nature Communications, 2023 Unraveling local dynamic charge processes is vital for progress in diverse fields, from microelectronics to energy storage. This relies on the ability to map charge carrier motion across multiple length- and timescales and understanding how these ...
Marti Checa +14 more
doaj +2 more sources
Tomographic and multimodal scattering-type scanning near-field optical microscopy with peak force tapping mode [PDF]
Nature Communications, 2018 Scanning near-field optical microscopy (SNOM) offers nanometer-scale spatial resolution, but generally does not retain tomographic information. Here, Wang et al. develop peak-force SNOM to section scattered fields and improve imaging resolution.
Haomin Wang +3 more
doaj +2 more sources
Removing the parachuting artifact using two-way scanning data in high-speed atomic force microscopy
Biophysics and Physicobiology, 2023 The high-speed atomic force microscopy (HS-AFM) is a unique and prominent method to observe structural dynamics of biomolecules at single molecule level at near-physiological condition.
Shintaroh Kubo +3 more
doaj +3 more sources
Probing Italy: A Scanning Probe Microscopy Storyline
Micro, 2023 Starting from the late 1980’s, scanning probe microscopy has progressively diffused in Italy until today. In this paper, we provide a brief account of the main historical events and a current picture of the distribution of the active groups. A survey was
Franco Dinelli +10 more
doaj +1 more source
Vectorial scanning force microscopy using a nanowire sensor. [PDF]
Nature Nanotechnology, 2016 Self-assembled nanowire (NW) crystals can be grown into nearly defect-free nanomechanical resonators with exceptional properties, including small motional mass, high resonant frequency and low dissipation.
N. Rossi +6 more
semanticscholar +1 more source
Polymers, 2022 Atomic force microscopy (AFM) is one of the microscopic techniques with the highest lateral resolution. It can usually be applied in air or even in liquids, enabling the investigation of a broader range of samples than scanning electron microscopy (SEM),
J. Joshi, S. V. Homburg, A. Ehrmann
semanticscholar +1 more source
Atomic force microscopy in energetic materials research: A review
Energetic Materials Frontiers, 2022 Modern trends in the development of energetic materials include the various methods of particle surface modification and the widespread use of nanosized powders.
Ekaterina K. Kosareva +2 more
doaj +1 more source