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Scanning Tunneling and Atomic Force Microscopies
1994The scanning tunneling microscope (STM) developed by Binnig and Rohrert(1–3) at the IBM Zurich research laboratory in the early 1980s was the first example of a new family of instruments based on a concept radically different from that of the optical and electron microscopes.
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Instrumentation for Scanning Force Microscopy and Friction Force Microscopy
1997Scanning Force Microscopes and Friction Force Microscopes are built in wide variety of designs. They have become welcome additions to industrial laboratories due to their ruggedness and because their measurement principle is, in many respects, a refinement of well established apparatus such as profilometers and tribometers.
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Comparison of Atomic Force Microscopy and Scanning Ion Conductance Microscopy for Live Cell Imaging.
Langmuir, 2015Jan Seifert +4 more
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Journal of Molecular Biology, 1996
C. Rivetti, M. Guthold, C. Bustamante
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C. Rivetti, M. Guthold, C. Bustamante
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SCANNING TUNNELING MICROSCOPY AND SCANNING FORCE MICROSCOPY
2006Hembacher, Stefan, Giessibl, Franz Josef
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Elasticity of normal and cancerous human bladder cells studied by scanning force microscopy
European Biophysics Journal, 1999M. Lekka +5 more
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Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system
Nanotechnology, 2012N. Pilet +8 more
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