Results 131 to 140 of about 2,073,769 (233)

Kelvin force microscopy of polymer and small molecule thin-film transistors

open access: yes, 2011
By their nature, scanning probe microscopy (SPM) measurements are ideally suited to the study of organic thin-film transistors (TFTs). In Chapter 3 surface potential measurements are made on TFTs made from the polymer pBTTT.
Bain, Stephen
core   +1 more source

Control of atomic force microscopes

open access: yes, 2014
Atomic force microscopes or AFMs are instruments which use a mechanical probe to scan a sample and estimate surface topography with nanometer accuracy. The term atomic force originates from the fact that the imaging process relies upon the existence of ...
Khan, Umar
core  

Scanning Probe Microscopy 2017 (SPM-2017)

open access: yesIOP Conference Series: Materials Science and Engineering, 2017
openaire   +1 more source

Live-Cell SICM Imaging: An Introductory Guide for New Users. [PDF]

open access: yesAnal Chem
Papa M   +3 more
europepmc   +1 more source

KL-8 Preparation and Aplication of Micro- and Nanostructures : Sensors for Scanning Probe Microscopy (SPM)

open access: yesThe Proceedings of the JSME Materials and Processing Conference (M&P), 2002
Rainer, Kassing   +2 more
openaire   +1 more source

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