Results 241 to 250 of about 77,080 (261)
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Physica B: Condensed Matter, 1983
Abstract An overview of the status of Scanning Tunneling Microscopy (STM) is given. So far, the method has been applied mainly to surface structures. Examples are given for reconstructions on metal and semiconductor surfaces and adsorbate structures.
Binnig, G., Rohrer, H.
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Abstract An overview of the status of Scanning Tunneling Microscopy (STM) is given. So far, the method has been applied mainly to surface structures. Examples are given for reconstructions on metal and semiconductor surfaces and adsorbate structures.
Binnig, G., Rohrer, H.
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1992
Abstract : Scanning tunneling microscopy (STM) has been used to image and modify the surfaces of III-V, II-VI and group IV semiconductors. A tip-simulator based on a photocode was developed. The simulator allows the development of ultra- sensitive electronics for controlling STM tip movement.
Selci S +8 more
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Abstract : Scanning tunneling microscopy (STM) has been used to image and modify the surfaces of III-V, II-VI and group IV semiconductors. A tip-simulator based on a photocode was developed. The simulator allows the development of ultra- sensitive electronics for controlling STM tip movement.
Selci S +8 more
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Photon Scanning Tunneling Microscopy
AIP Conference Proceedings, 1991A summary was not available at time of publication.
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Scanning Tunnelling Microscopy
Reports on Progress in Physics, 1992The scanning tunnelling microscope, or STM, has emerged over the last few years as a fascinating new technique for examining conducting solid surfaces with high resolution [10.1–5]. A sharpened metal wire is brought close enough to the surface so that the electrons “tunnel” across the narrow gap (0.5–1.5 nm).
L E C van de Leemput, H van Kempen
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Scanning Tunnelling Microscopy
1990Since its introduction by Binnig et al.,(1) the Scanning Tunnelling Microscope (STM) has engendered much excitement among surface scientists, not only for the atomically resolved surface topography it can achieve, but also for the range of surface spectroscopy possible.
M. E. Welland, M. E. Taylor
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Scanning tunnelling microscopy
Contemporary Physics, 1991Abstract Since its inception in 1982, the Scanning Tunnelling Microscope (STM) has had an increasing importance in the examination of surfaces at an atomic level in real space. The unique performance of this imaging technique stems from the quantum tunnelling process employed.
J. Shen +2 more
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Scanning tunnelling microscopy
Vacuum, 1994Scanning tunnolling microscop! (STM) is a rclativcly new tccbnique. originating as it does from pioneering work of Binnig and Rohrcr in the early 1980s ‘. The concept is relatively simple. J~tst place ;I slurp tungsten tip close to a conducting surl~lcc. so close that the W:ILC‘ functions of the closest tip atom and the surface atoms overlap.
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2018
STM is a surface microscope with extremely high spatial resolution, which enables us to see atoms on surfaces. When a sharp metal needle is located at a very proximate distance (~1 nm) from the sample surface (left panel in Fig. 97.1), tiny amount of electrical flow, called a tunneling current, is induced between them. Since the current is so sensitive
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STM is a surface microscope with extremely high spatial resolution, which enables us to see atoms on surfaces. When a sharp metal needle is located at a very proximate distance (~1 nm) from the sample surface (left panel in Fig. 97.1), tiny amount of electrical flow, called a tunneling current, is induced between them. Since the current is so sensitive
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Die Rastertunnelmikroskopie (STM) ermöglicht die Erstellung von hochauflösenden Bildern, sogar auf atomarer Ebene, ohne die Verwendung von hochenergetischen Elektronenstrahlen. Entwickelt wurde die STM im Jahr 1981 von den IBM-Physikern Heinrich Rohrer und Gerd Binnig, die dafür 1986 den Nobelpreis für Physik erhielten.
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SCANNING TUNNELING MICROSCOPY AND SCANNING FORCE MICROSCOPY
2006Hembacher, Stefan, Giessibl, Franz Josef
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