Results 241 to 250 of about 2,535,001 (327)

Fabrication of on-chip probes for double-tip scanning tunneling microscopy. [PDF]

Microsyst Nanoeng, 2020
Leeuwenhoek M, Groenewoud F, van Oosten K, Benschop T, Allan MP, Gröblacher S.   +5 more
europepmc   +1 more source

Reliable Ru‐Based CBRAM Synapses for Energy‐Efficient Neuromorphic Computing: Suppressing Filament Overgrowth and Read Noise via Ru‐Pt Alloy and AlOx Engineering

Advanced Electronic Materials, EarlyView.
Ru–Pt alloying suppresses filament overgrowth and an AlOx switching layer enhances reliable switching, hopping transport enables conductance tuning via hopping distance modulation, Ru7Pt3/AlOx/Pt device yields 16 low‐noise conductance states, a 2–3‐fold improvement over prior Ru‐based CBRAM, and CSNN inference on FMNIST reaches 81% accuracy with 103 ...
Sangmin Lee, Sungmin Yoo, Yeonjoo Jeong, Jaewook Kim, Hyun Jae Jang, Jongkil Park, Seongsik Park, Suyoun Lee, Byeong‐Kwon Ju, Jong Keuk Park, Inho Kim   +10 more
wiley   +1 more source

Characterization of Coulomb Interactions in Electron Transport Through a Single Hetero-Helicene Molecular Junction Using Scanning Tunneling Microscopy. [PDF]

J Phys Chem A
Shi Y, Bi L, Wang Z, Liang K, Li JK, Wang XY, Li WL, Li S.   +7 more
europepmc   +1 more source

Dual‐Defect‐Engineered Zinc Oxynitride Thin‐Film Transistors Enabling Electrostatic Current Balancing in Geometrically Symmetric Oxide Logic

Advanced Electronic Materials, EarlyView.
Dual‐defect engineering controls subgap states in zinc oxynitride (ZnON) thin‐film transistors, yielding a field‐effect mobility of 26.58 cm2 V−1 s−1. A process‐associated threshold‐voltage shift is repurposed within a dual‐gate depletion‐mode load to electrostatically balance current in a geometrically symmetric NMOS inverter.
Seung Min Lee, Dong Hyeon Kim, Ji Won Woo, Dong Beom Lee, Kye Yeong Jo, Joo Hyun Jeong, Yun Hyeok Jeong, Joon Hwang, Sang Jik Kwon, Eou‐Sik Cho, Min‐Kyu Park   +10 more
wiley   +1 more source

Electron localization in defective ceria films: a study with scanning-tunneling microscopy and density-functional theory.

Physical Review Letters, 2011
Jan-Frederik Jerratsch, Xiang Shao, N. Nilius, H. Freund, C. Popa, M. Ganduglia-Pirovano, Asbjörn M. Burow, J. Sauer   +7 more
semanticscholar   +1 more source

Spotlight: Visualization of Moiré Quantum Phenomena in Transition Metal Dichalcogenide with Scanning Tunneling Microscopy. [PDF]

ACS Appl Electron Mater
Zhou H, Liang K, Bi L, Shi Y, Wang Z, Li S.   +5 more
europepmc   +1 more source

Manipulation of Molecular Spin State on Surfaces Studied by Scanning Tunneling Microscopy. [PDF]

Nanomaterials (Basel), 2020
Xu Z, Liu J, Hou S, Wang Y.
europepmc   +1 more source

Advancing Energy Materials by In Situ Atomic Scale Methods

Advanced Energy Materials, Volume 15, Issue 11, March 18, 2025.
Progress in in situ atomic scale methods leads to an improved understanding of new and advanced energy materials, where a local understanding of complex, inhomogeneous systems or interfaces down to the atomic scale and quantum level is required. Topics from photovoltaics, dissipation losses, phase transitions, and chemical energy conversion are ...
Christian Jooss, Michael Seibt, Martin Wenderoth, Oliver Bünermann, Ole Bunjes, Till Domröse, Christian Eckel, Francesca Falorsi, Christoph Flathmann, Monica Kolek Martinez de Azagra, Matthias Krüger, Jonas Lindner, Tobias Meyer, Claus Ropers, Ulrich Ross, Kai Rossnagel, Sreeju Sreekantan Nair Lalithambika, Simone Techert, Georg A. Traeger, Cynthia Volkert, R. Thomas Weitz, Alec M. Wodtke   +21 more
wiley   +1 more source

Unraveling the Interfacial Carrier Behavior in PtSe₂-MoSe₂ Heterostructures: Insights from Combined Pump-Probe Spectroscopy and Scanning Tunneling Microscopy. [PDF]

Adv Sci (Weinh)
Zhang W, Chen H, Peng J, Pan X, Bai H, Jing F, Qiu H, Hu Z, Wu Y, Liu H.   +9 more
europepmc   +1 more source

Atomic-Scale Patterning of Arsenic in Silicon by Scanning Tunneling Microscopy. [PDF]

ACS Nano, 2020
Stock TJZ, Warschkow O, Constantinou PC, Li J, Fearn S, Crane E, Hofmann EVS, Kölker A, McKenzie DR, Schofield SR, Curson NJ.   +10 more
europepmc   +1 more source