Results 11 to 20 of about 20,734 (282)

Coherent scanning tunneling microscopy [PDF]

open access: yesScience, 2020
Ultrafast phase-stabilized optical pulses add temporal resolution to high spatial ...
openaire   +3 more sources

Atomic Force Microscopy and Real Atomic Resolution. Simple Computer Simulations. [PDF]

open access: yes, 1994
Using a simple computer simulation for AFM imaging in the contact mode, pictures with true and false atomic resolution are demonstrated. The surface probed consists of two f.c.c.
Brinke, G. ten,   +3 more
core   +11 more sources

Scanning Tunneling Microscopy

open access: yesHyomen Kagaku, 1989
STMの発明から現在に至る研究を振りかえり, 原子構造に関連する主要な研究についてまとめた。STMを観察する上でまず問題となる装置的課題のうち, 機構上の問題を除外して探針や真空について述べる。観察結果としてSi (111) および (001) 清浄表面に現れる7×7と2×1再配列構造を中心に, それらへの金属原子の付着による吸着構造について言及する。他に金属表面および生体・高分子の観察例を簡単に説明する。現在までの観察結果と本年開催された国際会議動向から今後の研究を展望する。
Selci S   +7 more
  +10 more sources

ARMScope – the versatile platform for scanning probe microscopy systems

open access: yesMetrology and Measurement Systems, 2020
Scanning probe microscopy (SPM) since its invention in the 80’s became very popular in examination of many different sample parameters, both in university and industry. This was the effect of bringing this technology closer to the operator.
Świadkowski Bartosz   +8 more
doaj   +1 more source

Scanning tunneling microscopy.

open access: yesBulletin of the Japan Institute of Metals, 1986
Abstract Scanning Tunneling Microscopy (STM) is a new method for studying surface phenomena in semiconductors and metals on an atomic scale. A metal tip is scanned over the surface at such a small distance that a tunneling current in the nanoamp range flows under application of a voltage between tip and sample. Surface areas are scanned by moving the
Toshio SAKURAI   +2 more
  +7 more sources

Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy

open access: yesBeilstein Journal of Nanotechnology, 2020
The combination of scanning tunnelling microscopy (STM) and non-contact atomic force microscopy (nc-AFM) allows enhanced extraction and correlation of properties not readily available via a single imaging mode.
Jeremiah Croshaw   +3 more
doaj   +1 more source

Atomically-resolved interlayer charge ordering and its interplay with superconductivity in YBa2Cu3O6.81

open access: yesNature Communications, 2021
Charge ordering and superconductivity are known to compete in layered cuprates; however, precise real-space characterization of their interplay has been lacking. Here, the authors address this using atomically-resolved cross-sectional scanning tunnelling
Chun-Chih Hsu   +9 more
doaj   +1 more source

Nanoscale decoupling of electronic nematicity and structural anisotropy in FeSe thin films

open access: yesNature Communications, 2021
Here, in contrast to previous observations in Fe-based superconductors, scanning tunnelling microscopy of strain-patterned FeSe thin films reveals a local decoupling of electron nematicity and structural anisotropy, pointing towards a stiffness of the ...
Zheng Ren   +5 more
doaj   +1 more source

Envision and Appraisal of Biomolecules and Their Interactions through Scanning Probe Microscopy

open access: yesSmall Structures, 2023
Scanning probe microscopy (SPM) has gifted a novel eye to envision nanotechnology and nanoscience. The SPM technique involves a sharp probe that moves over the sample surface and leads to produce signals, which facilitates a deep understanding of the ...
Prachi Ghoderao   +3 more
doaj   +1 more source

Synchronous Electrical Conductance‐ and Electron Tunnelling‐Scanning Electrochemical Microscopy Measurements

open access: yesChemElectroChem, 2020
The requirement to separate topographical effects from surface electrochemistry information is a major limitation of scanning electrochemical microscopy (SECM).
James F. Edmondson   +3 more
doaj   +1 more source

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