Results 251 to 260 of about 120,503 (315)

Brass-mesh-bolus-Radiation safety analysis and activation characterization following high energy photon treatment. [PDF]

J Appl Clin Med Phys
Mallory RC, Woods K, McCullough K.
europepmc   +1 more source

Solving disorder in (3D) real space: a comparative study of the three‐dimensional difference pair distribution function and atomic resolution holography reconstructions

Journal of Applied Crystallography, EarlyView.
This study uses computational models to compare the three‐dimensional difference pair distribution function and atomic resolution holography for analyzing three‐dimensional disorder, revealing their complementary strengths in quantitative pair correlation analysis versus chemical specificity and advocating for a combined approach to tackle complex ...
Jens R. Stellhorn, Arianna Minelli, Emily G. Meekel, Ella M. Schmidt   +3 more
wiley   +1 more source

Scaling Up Purcell-Enhanced Self-Assembled Nanoplasmonic Perovskite Scintillators into the Bulk Regime. [PDF]

Adv Mater
Makowski M, Ye W, Kowal D, Maddalena F, Mahato S, Amrillah YT, Zajac W, Witkowski ME, Drozdowski KJ, Nathaniel, Dang C, Cybinska J, Drozdowski W, Nugroho FAA, Dujardin C, Wong LJ, Birowosuto MD.   +16 more
europepmc   +1 more source

Cold versus thermal neutron source: assessment of performance of the KWS‐2 SANS diffractometer of the Jülich Centre for Neutron Science at the FRM II reactor

Journal of Applied Crystallography, EarlyView.
The performance of the small‐angle neutron scattering (SANS) diffractometer KWS‐2 is evaluated by measurements and McStas simulations under the condition that only the thermal neutron source is available at the FRM II reactor. This is compared with the established performance with cold neutrons provided by the cold neutron source.The small‐angle ...
Aurel Radulescu, Ralf Biehl, Aristeidis Papagiannopoulos   +2 more
wiley   +1 more source

An anti-thermal-quenching organic-inorganic hybrid manganese-based single-crystal scintillator for high-temperature X-ray imaging. [PDF]

Chem Sci
Chen JH, Luo JB, He ZL, Peng QP, Wei JH, Zhang ZZ, Guo XX, Kuang DB.   +7 more
europepmc   +1 more source

Compression–tension cell with sample manipulator for in situ X‐ray nanotomography experiments

Journal of Synchrotron Radiation, EarlyView.
An environmental cell with fluid flow‐through capability for performing in situ nano‐mechanical experiments at X‐ray nanotomography beamlines and a sample manipulator for mounting nanotomography samples are described.In situ X‐ray nanotomography experiments where tensile or compressive force is applied on the sample require specialized equipment.
Arun J. Bhattacharjee, Harold S. Barnard, Alastair MacDowell, Dilworth Parkinson, Harrison P. Lisabeth   +4 more
wiley   +1 more source

Enhancing the Cherenkov over scintillation ratio using dichroic filters in BGO and TlCl for TOF-PET. [PDF]

Sci Rep
Mehrdel B, Kratochwil N, Seo Y, Glodo J, Bhattacharya P, Ariño-Estrada G, Caravaca J.   +6 more
europepmc   +1 more source

Eikonal Phase Retrieval: unleashing the potential of fourth‐generation sources for enhanced propagation‐based tomography on biological samples

Journal of Synchrotron Radiation, EarlyView.
A new iterative phase retrieval algorithm, Eikonal Phase Retrieval, tackles large phase gradients and yields higher‐quality propagation‐based X‐ray tomography of strongly heterogeneous biological samples.The evolution of synchrotrons towards higher brilliance beams has increased the possible sample‐to‐detector propagation distances for which the source
Alessandro Mirone, Joseph Brunet, Theresa Urban, Hector Dejea, Leandre Admans, Renaud Boistel, Morgane Sowinski, Pierre Paleo, Henry Payno, Stijn E. Verleden, Camille Berruyer, Elodie Boller, Claire L. Walsh, Peter D. Lee, Paul Tafforeau   +14 more
wiley   +1 more source

A Sensor Employing an Array of Silicon Photomultipliers for Detection of keV Ions in Time-of-Flight Mass Spectrometry. [PDF]

Sensors (Basel)
Mariscal-Castilla A, Piller M, Alozy J, Ballabriga R, Campbell M, de la Torre O, Gascón D, Gómez S, Heathcote D, Mauricio J, Milesevic D, Sanuy A, Vallance C, Guberman D.   +13 more
europepmc   +1 more source

Arbitrary thickness profile metrology of low‐Z and monolithic material components with a single X‐ray projection

Journal of Synchrotron Radiation, EarlyView.
A thickness metrology method based on X‐ray phase contrast imaging is proposed. By precisely retrieving the phase shift of X‐rays passing through the sample, high‐precision arbitrary thickness profile measurement can be achieved with a single X‐ray projection. A measurement case of a microlens array is presented to demonstrate the effectiveness of this
Wenjie Hao, Feixiang Wang, Fucheng Yu, Kang Du, Ke Li, Junxiong Fang, Tiqiao Xiao   +6 more
wiley   +1 more source