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Gas breakdown and secondary electron yields
The European Physical Journal D, 2014In this paper we present a systematic study of the gas breakdown potentials. An analysis of the key elementary processes in low-current low-pressure discharges is given, with an aim to illustrate how such discharges are used to determine swarm parameters and how such data may be applied to modeling discharges. Breakdown data obtained in simple parallel-
Dragana Marić +6 more
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Secondary electron yield in the Bendix channel electron multiplier
Nuclear Instruments and Methods, 1977Abstract The secondary emission yield of the emissive layer of a Bendix channel electron multiplier was measured using an electron beam for energies between 100 eV and 1 keV. This yield reaches δ = 3.6 at about 350 eV in a channel electron multiplier at the end of the desorption phase.
Claude Barat, Jacques Coutelier
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Formula for secondary electron yield from metals
High Power Laser and Particle Beams, 2012On the basis of the dominant physical processes of secondary electron emission, the relationship among secondary electron yield, the ratio of the mean secondary electron generation of one backscattered electron to that one of a primary electron, primary energy, the parameter E(z), maximum yield and backscattered electron coefficient was deduced.
谢爱根 Xie Aigen +3 more
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Secondary Electron Yield from Fission Fragments
Journal of Applied Physics, 1965The secondary electron yield from fission fragments has been measured directly using an ultrahigh-vacuum diode containing uranium which was operated in a nuclear reactor. The current measured in this diode consisted of contributions from the positively charged fission fragments, secondary electron emission induced by fission fragments, and ...
F. E. Jamerson +2 more
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Secondary electron yield of multiwalled carbon nanotubes
Applied Physics Letters, 2010Secondary electron yield from individual multiwalled carbon nanotubes is investigated for a wide range of primary beam energies (0.5–15 keV). By using a simple experimental procedure under an optical microscope, we make suspended nanotubes, which are free from interaction with the substrate during electron yield measurements.
M. K. Alam +3 more
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Secondary Electron Yield of SRF Materials
2015The secondary electron yield (SEY) describes the number of electrons emitted to the vacuum per arriving electron at the surface. For a given geometry, the SEY is the defining factor for multipacting activity. In the quest of superconducting RF materials beyond bulk niobium, we studied the SEY of the currently most important candidates for future SRF ...
Aull, Sarah +3 more
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Secondary electron emission yield behaviour of polymers
Solid State Communications, 1973Abstract The secondary electron emission yields of highly-insulating, thin polymer foils have been measured for incident primary beam energies, 50 ⩽ E p ⩽ 2500 eV. The results follow closely a ‘universal’ reduced yield curve determined by the energy loss law, d E p /d x = - A / E p n -1 , where n = 2 and A is a constant proportional ...
R.F. Willis, D.K. Skinner
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The Secondary Electron Yield from Transition Metals
2014Non-evaporable getter thin films, which are currently being used in the ultra-high vacuum system of the Large Hadron Collider, normally consist of Ti, Zr and V, deposited by physical vapour deposition. In this study, the secondary electron yield (SEY) of bulk Ti, Zr, V and Hf have been investigated as a function of electron conditioning.
Wang, Sihui +4 more
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Surface spacings from the secondary electron yield
Applications of Surface Science, 1980Abstract Small inflections in plots of the total yield of secondary electrons versus primary electron energy were reported more than fifty years ago and attributed variously to thresholds for the excitation of core states, and to diffraction of the incident electrons.
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Analytical model of secondary electron emission yield in electron beam irradiated insulators
Micron, 2018The study of secondary electron emission (SEE) yield as a function of the kinetic energy of the incident primary electron beam and its evolution with charge accumulation inside insulators is a source of valuable information (even though an indirect one) on charge transport and trapping phenomena.
N, Ghorbel, A, Kallel, G, Damamme
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