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The secondary-electron yield from beryllium—copper
International Journal of Mass Spectrometry and Ion Physics, 1978Abstract A comparative study has been made of differing activation methods for improving the secondary-electron yield from beryllium—copper and for preparing stable dynode-metal surfaces for electron-multiplier ion detectors. A simple electron-gun and target assembly are described which can be used for the rapid assessment of prepared surfaces ...
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Secondary electron yield enhancement by MgO capping layers
Surface Science, 2010Abstract The yield of secondary electrons emitted from an epitaxial three monolayer (3 ML) NiO(1 0 0)/Ag(1 0 0) film excited by soft X-ray linearly polarized synchrotron radiation at the Ni L 2,3 absorption threshold has been measured for different values of the thickness of a MgO(1 0 0) capping layer. Compared with the as grown 3 ML NiO(1 0 0)/Ag(
S. Altieri +6 more
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Secondary Electron Yield Measurement and Electron Cloud Simulation at Fermilab
2015Fermilab Main Injector is upgrading the accelerator to double the beam intensity from 24·10¹² protons to 48·10¹² protons, which brings the accelerator into a regime where electron cloud effects may limit the accelerator performance. In fact, an instability that could be caused by electron cloud effects has already been observed in the Recycler ...
Ji, Yichen +2 more
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Prelimary Data for Suppression of Secondary Electron yield
2018 IEEE International Conference on Plasma Science (ICOPS), 2018The multipactor effect is a discharge phenomenon which may occur when secondary electron emission (SEE) is in resonance with an electric field under certain vacuum conditions [1]. Liberated electrons will oscillate between two surfaces driven by a radio frequency (RF) field; this discharge cultivates and sustains itself by SEE through reoccurring ...
Joe M. Chen +5 more
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Secondary electron yield with primary electron beam of kilo-electron-volts
Journal of Applied Physics, 1974Secondary electron yields δPE due to primary electrons of kilo-electron-volts are estimated for various metals by measuring total electron yields δT in an UHV system and using a Monte Carlo calculation to derive δPE from δT. The dependences of δT/δPE as well as δPE on both the atomic number Z and primary energy are also discussed from a theoretical ...
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MAXIMUM SECONDARY ELECTRON YIELDS FROM SEMICONDUCTORS AND INSULATORS
Surface Review and Letters, 2016Based on the processes and characteristics of secondary electron emission and the formula for the yield due to primary electrons hitting on semiconductors and insulators, the universal formula for maximum yield [Formula: see text] due to primary electrons hitting on semiconductors and insulators was deduced, where [Formula: see text] is the maximum ...
A. G. XIE +3 more
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Effects of secondary electron scattering on secondary emission yield curves
Journal of Applied Physics, 1973The power-law and constant-loss theories of secondary electron emission have been modified to include the effects of secondary scattering within the solid. For power-law exponent values of 1.35, 1.66, and 2.00, the scattering effects reduced penetration depths at maximum yield by almost a factor of 2 and decreased the maximum yields by about 70% in ...
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Noise in secondary electron emission: the low yield case
Microscopy, 2005Studies concerning assessment of the image quality in scanning electron microscopes and studies evaluating the detective efficiency of the secondary electron (SE) detectors in these microscopes must be based on statistics of SE emission. The vast majority of previous studies have applied Poisson statistics, although their prerequisites have not been ...
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FORMULA FOR MAXIMUM SECONDARY ELECTRON YIELD FROM METALS
Surface Review and Letters, 2015Based on free-electron model, the calculated inelastic mean escape depth of secondary electrons, experimental one, the energy band of metal, the characteristics and processes of secondary electron emission, maximum number of secondary electrons released per primary electron δ(Φ,EF)PEm as a function of parameter Km, work function Φ and Fermi energy EF ...
AI-GEN XIE, LING WANG, LIU-HUA MU
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Parameters of the secondary electron yield from metal
Journal of the Korean Physical Society, 2013Based on a simple classical model that primary electrons interact with the electron of a lattice via a Coulomb force, the condition that the lattice scattering can be ignored and the energy band of metal, we deduced the formula for the average energy required to produce a secondary electron in metal (ɛ m
Ai-Gen Xie, Hong-Yan Wu, Jia Xu
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